大阪大学森田研ウェブサイト

■Prof. Seizo Morita

Seizo Morita

Osaka University
Graduate School of Engineering
Division of Electrical, Electronic
and Information Engineering
Department of of Quantum Electronic Device Engineering

Suita, Osaka 565-0871, Japan

http://www-e2.ele.eng.osaka-u.ac.jp/

　　　Prof. Seizo Morita works in the atomic force microscopy (AFM). He
has discovered two-dimensional friction with a lattice periodicity [1],
two-dimensional solid phase of densely contact-electrified electrons on
SiO2 thin films under ambient conditions [2], and atom interchange
manipulation phenomena [3]. He has achieved true atomic resolution [4],
atom selective imaging [5], force curve measurement of individual
atoms at room temperature [6], vertical [7] and lateral [8] atom
manipulation, and construction of "Atom Inlay", i.e., embedded atom
letters [3], based on a mechanical method using precisely controlled
noncontact and nearcontact AFM apparatus.

References
[1] S.Morita, S.Fujisawa and Y.Sugawara; "Spatially quantized friction with a lattice periodicity",
Surface Science Reports, Vol.23, No.1 (1996) pp.1-42.
[2] S.Morita and Y.Sugawara; "Microscopic contact charging and dissipation", Thin Solid Films, Vol.393 (2001)
pp.310-318.
[3] Y.Sugimoto, M.Abe, S.Hirayama, N.Oyabu, O.Custance and S.Morita; "Atom inlays performed
at room temperature using atomic force microscopy", Nature Materials, Vol. 4, issue 2 (2005), pp.156-159.
[4] Y.Sugawara, M.Ohta, H.Ueyama and S.Morita; "Defect Motion on InP(110) Surface Observed
with Noncontact Atomic Force Microscopy", Science, Vol.270 (1995) pp.1646-1648.
[5] Y.Sugimoto, M.Abe, K.Yoshimoto, O.Custance, I.Yi and S.Morita; "Non-contact atomic force microscopy study of
the Sn/Si(111)
mosaic phase", Applied Surface Science, Vol.241, Issues 1-2 (2005) pp.23-27.
[6] M.Abe, Y.Sugimoto, O.Custance and S.Morita; "Room-temperature reproducible spatial force spectroscopy using
atom-tracking technique", Appl.Phys.Lett. Vol.87, Issue 17 (2005) pp.173503-1~173503-3.
[7] N.Oyabu, O.Custance, I.Yi, Y.Sugawara and S.Morita; "Mechanical Vertical Manipulation of Selected Single Atoms
by Soft Nanoindentation Using Near Contact Atomic Force Microscopy", Phys.Rev.Lett. Vol.90, No.17 (2003), pp.
176102-1~176102-4.
[8] N.Oyabu, Y.Sugimoto, M.Abe, O.Custance and S.Morita; "Lateral manipulation of single atoms
at semiconductor surfaces using atomic force microscopy", Nanotechnology, Vol.16, No.3 (2005) pp.S112-S117.

Other Related References
(1) S.Morita, R.Wiesendanger and E.Meyer (eds.); "Noncontact Atomic Force Microscopy", Springer, NanoScience and
Technology (2002) pp.1-439.
(2) T.Uchihashi, M.Tanigawa, M.Ashino, Y.Sugawara, K.Yokoyama, Morita and M.Ishikawa; "Identification of B-form DNA
in an Ultrahigh Vacuum by
Noncontact-mode Atomic Force Microscopy", Langmuir, Vol.16, No.3 (2000) pp.1349-1353.
(3) S.Morita, M.Abe, K.Yokoyama and Y.Sugawara; "Defects and their charge imaging on semiconductor surfaces
by noncontact atomic force microscopy and spectroscopy", J.Cryst.Growth, Vol.210 (2000) pp.408-415.
(4) T.Uchihashi, T.Ishida, M.Komiyama, M.Ashino, Y.Sugawara, W.Mizutani, K.Yokoyama, S.Morita, H.Tokumoto and
M.Ishikawa,
"High-resolution imaging of organic monolayers using noncontact AFM", Appl.Surf.Sci. Vol.157, No.4 (2000)
pp.244-250.
(5) M.Ashino, Y.Sugawara, S.Morita and M.Ishikawa; "ATOMIC RESOLUTION NONCONTACT ATOMIC FORCE AND SCANNING
TUNNELING MICROSCOPY OF TiO2[110]-[1x1]
AND -[1x2]: SIMULTANEOUS IMAGING OF SURFACE STRUCTURE AND ELECTRONIC STATES", Phys.Rev.Lett. Vol.86, No.19
(2001) pp.4334-4337.
(6) K.Okamoto, K.Yoshimoto, Y.Sugawara and S.Morita; "KPFM imaging of Si(111)5r3x5r3-Sb surface for atom
distinction using NC-AFM",
Appl.Surf.Sci. Vol.210, Nos.1-2 (2003) pp.128-133.
(7) I.Brihuega, O.Custance, M.M.Ugeda, N.Oyabu, S.Morita and J.M.Gomez-Rodriguez; "Direct Observation
of a (3x3) Phase in α-Pb/Ge(111) at 10 K", Phys.Rev.Lett. Vol.95 (2005) pp.206102-1~206102-4.