Publication

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paper 2015

Pt atoms adsorbed on TiO2(110)(1x1) studied with noncontact atomic force microscopy and firstprinciples simulations
Physical Review B
91 (2015) 075401

D. Fernandez-Torre, A. Yurtsever, J. Onoda, M. Abe, S. Morita, Y. Sugimoto, and R. Perez
Room-temperature-concerted switch made of a binary atom cluster                                             
Nature Communications
6 (2015) 6231
E. Inami, I. Hamada, K. Ueda, M. Abe, S. Morita, and Y. Sugimoto

paper 2014

Identifying the absolute orientation of a low-symmetry surface in real space
Physical Review B
90 (2014) 195405
S. Kuhn, M. Kittelmann, Y. Sugimoto, M. Abe, A. Kuhnle, and P. Rahe
Direct observation and mechanism for enhanced field emission sites in platinum ion implanted/post-annealed ultrananocrystalline diamond films
Applied Physics Letters
105 (2014) 163109
K. Panda, K.J. Sankaran, E. Inami, Y. Sugimoto, N.H. Tai, and I.-N. Lin
Atomic-dipole-moment induced local surface potential on Si(111)-(7×7) surface studied by non-contact scanning nonlinear dielectric microscopy
Applied Physics Letters
105 (2014) 121601
K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho
(2nx1) Reconstructions of TiO2(011) Revealed by Noncontact Atomic Force Microscopy and Scanning Tunneling Microscopy
The Journal of Physical Chemistry C
118 (2014) 23168
C.L. Pang, A. Yurtsever, J. Onoda, Y. Sugimoto, and G. Thornton
Improved study of electric dipoles on the Si(100)-2x1 surface by non-contact scanning nonlinear dielectric microscopy
Applied Physics Letters
105 (2014) 101603
M. Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho
Mechanical gate control for atom-by-atom cluster assembly with scanning probe microscopy
Nature Communications
5 (2014) 4360
Y. Sugimoto, A. Yurtsever, N. Hirayama, M. Abe, and S. Morita
Subsurface Charge Repulsion of Adsorbed H-Adatoms on TiO2(110)
The Journal of Physical Chemistry C
118 (2014) 13674
J. Onoda, C.L. Pang, A. Yurtsever, and Y. Sugimoto
Initial and secondary oxidation products on the Si(111)-(7 × 7) surface identified by atomic force microscopy and first principles calculations
Applied Physics Letters
104 (2014) 133107
J. Onoda, M. Ondracek, A. Yurtsever, P. Jelinek, and Y. Sugimoto

paper 2013

Quantum degeneracy in atomic point contacts revealed by chemical force and conductance
Physical Review Letters
111 (2013) 106803 (Selected for Editors' suggestion)
Y. Sugimoto, M. Ondracek, M. Abe, P. Pou, S. Morita, R. Perez, F. Flores, and P. Jelinek
Role of Tip Chemical Reactivity on Atom Manipulation Process in Dynamic Force Microscopy
ACS Nano
8 (2013) 7370
Y. Sugimoto, A. Yurtsever, M. Abe, S. Morita, M. Ondracek, P. Pou, R. Perez, and P. Jelinek
Mechanical Properties of Various Phases on In/Si(111) Surfaces Revealed by Atomic Force Microscopy
Applied Physics Express
6 (2013) 155403
K. Iwata, S. Yamazaki, Y. Tani, and Y. Sugimoto
Force mapping on a partially H-covered Si(111)-(7×7) surface: In?uence of tip and surface reactivity
Physical Review B
87 (2013) 155403
A. Yurtsever, Y. Sugimoto, H. Tanaka, M. Abe, S. Morita, M. Ondracek, P. Pou, R. Perez, and P. Jelinek
Simultaneous noncontact AFM and STM of Ag:Si(111)-(R3xR3)R30
Physical Review B
87 (2013) 075310
A. Sweetman, A. Stannard, Y. Sugimoto, M. Abe, S. Morita, and P. Moriarty

paper 2012

Effect of tip polarity on Kelvin probe force microscopy images of thin insulator CaF2 films on Si(111)
Applied Physics Letters
101 (2012) 083119
A. Yurtsever, Y. Sugimoto, M. Fukumoto, M. Abe, and S. Morita
Understanding image contrast formation in TiO2 with force spectroscopy
Physical Review B
85 (2012) 125416
A. Yurtsever, D. Fernandez-Torre, C. Gonzalez, P. Jelinek, P. Pou, Y. Sugimoto, M. Abe, R. Perez, and S. Morita
Three dimensional scanning force/tunneling spectroscopy at room temperature
Journal of Physics: Condensed Matter
24 (2012) 084008
Y. Sugimoto, K. Ueda, M. Abe, and S. Morita

paper 2011

Simultaneous Scanning Force/Tunneling Microscopy Using a Quartz Cantilever with a Tungsten Tip
Applied Physics Express
4 (2011) 115201
K. Morita, Y. Sugimoto, M. Abe, and S. Morita
Kelvin probe force microscopy characterization of TiO2(110)-supported Au clusters
Applied Physics Letters
99 (2011) 123102
H.J. Chung, A. Yurtsever, Y. Sugimoto, M. Abe, and S. Morita
Alkali-metal adsorption and manipulation on hydroxylated TiO2(110) surface using atomic force microscopy
Physical Review B
84 (2011) 085413
A. Yurtsever, Y. Sugimoto, M. Abe, K. Matsunaga, I. Tanaka, and S. Morita
Fabrication of quartz cantilevers for small-amplitude dynamic force microscopy using an optical deflection sensor
Japanese Journal of Applied Physics
50 (2011) 08LB12
K. Morita, Y. Sasagawa, Y. Murai, Y. Sugimoto, M. Abe, and S. Morita
Flexible drift-compensation system for precise 3D force mapping in severe drift environments
Review of Scientific Instruments 82 (2011) 063704 P. Rahe, J. Schutte, W. Schniederberend, M. Reichling, M. Abe, Y. Sugimoto, and A. Kuhnle
Lateral Manipulation of Single Defect on Insulating Surface Using Noncontact Atomic Force Microscope
Japanese Journal of Applied Physics 50 (2011) 015201 I. Yi, R. Nishi, M. Abe, Y. Sugimoto, and S. Morita

paper 2010

Observation of subsurface atoms of the Si(111)-(7x7) surface by atomic force microscopy
Applied Physics Express
3 (2010) 116602
D. Sawada, Y. Sugimoto, M. Abe, and S. Morita
Accurate formula for conversion of tunneling current in dynamic atomic force spectroscopy
Applied Physics Letters
97 (2010) 043502
J.E. Sader and Y. Sugimoto
Small-amplitude dynamic force microscopy using a quartz cantilever with an optical interferometer
Nanotechnology
21 (2010) 305704
K. Morita, Y. Sugimoto, Y. Sasagawa, M. Abe, and S. Morita
Simultaneous force and current mapping of the Si(111)-(7x7) surface by dynamic force microscopy
Applied Physics Letters
96 (2010) 263114
Y. Sugimoto, I. Yi, K. Morita, M. Abe, and S. Morita
Simultaneous AFM and STM measurements on the Si(111)-(7x7) surface
Physical Review B
81 (2010) 245322
Y. Sugimoto, Y. Nakajima, D. Sawada, K. Morita, M. Abe, and S. Morita
NC-AFM imaging of the TiO2(110)-(1x1) surface at low temperature
Nanotechnology
21 (2010) 165702
A. Yurtsever, Y. Sugimoto, M. Abe, and S. Morita
Simultaneous atomic-force and scanning-tunneling microscopy study of the Ge(111)-c(2x8) surface
Jounal of Vacuum Science & Technology B
28 (2010) C4D1
D. Sawada, Y. Sugimoto, K. Morita, M. Abe, and S. Morita

paper 2009

New insights on atomic-resolution frequency-modulation Kelvin probe force microscopy imaging on semiconductors
Physical Review Letters
103 (2009) 266103
S. Saderwasser, P. Jelinek, C.K. Fang, O. Custance, Y. Yamada, Y. Sugimoto, M. Abe, and S. Morita
Simultaneous measurement of force and tunneling current at room temperature
Applied Physics Letters
94 (2009) 173117
D. Sawada, Y. Sugimoto, K. Morita, M. Abe, and S. Morita
Simultaneous atomic imaging of atomic force microscopy and scanning tunneling microscopy using metal coated cantilevers
Materilas Transactions
50 (2009) 940
D. Sawada, A. Hrai, Y. Sugimoto, M. Abe, and S. Morita
Mapping and imaging for rapid atom discrimination: A study of frequency modulation atomic force microscopy
Applied Physics Letters
94 (2009) 023108
Y. Sugimoto, T. Namikawa, M. Abe, and S. Morita

paper 2008

Statictics of lateral atom manipulation by atomic force microscopy at room temperature
Physical Review B
78 (2008) 205305
Y. Sugimoto, K. Miki, M. Abe, and S. Morita
Complex patterning by vertical interchange atom manipulation using atomic force microscopy
Science
322 (2008) 413
Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, and S. Morita
Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy
Physical Review B
77 (2008) 195424
Y. Sugimoto, T. Namikawa, K. Miki, M. Abe, and S. Morita
High spatial resolution topographic imaging and dimmer distance analysis of Si(100)-(2x1) using non-contact atomic force microscopy
Japnese Jounal of Applied Physics
47 (2008) 6085
D. Sawada, T. Namikawa, M. Hiragaki, Y. Sugimoto, M. Abe, and S. Morita
Atom-by-atom chemical coorination effect observed in non-contact AFM topography of Pb/Si(111)-(R3xR3) mosaic phase
e-Journal of Surface Science and Nanotechnology
6 (2008) 79
A. Ohiso, Y. Sugimoto, K. Mizuta, M. Abe, and S. Morita

paper 2007

Dynamic force spectroscopy using cantilever higher flexural modes
Applied Physics Letters
91 (2007) 093120
Y. Sugimoto, S. Innami, M. Abe, O. Custance, and S. Morita
Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy
Applied Physics Letters
90 (2007) 203103
M. Abe, Y. Sugimoto, T. Namikawa, K. Morita, N. Oyabu, and S. Morita
Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy
Physical Review Letters
98 (2007) 106104
Y. Sugimoto, P. Jelinek, P. Pou, M. Abe, S. Morita, R. Perez, and O. Custance
Toward Atom-by-Atom Assembly of Compound Semiconductor Nanostructures: Mechanical Atomic discrimination and Atomic Manipulation at Room Temperature
Current Nanoscience
3 (2007) 31
S. Morita, Y. Sugimoto, and M. Abe
Chemical identification of individual surface atoms by atomic force microscopy
Nature
446 (2007) 64
Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S. Morita, and O. Custance
Non-contact atomic force microscopy investigation of the (1x1) and (R3xR3) phases on the Pb/Si(111) surface
e-Journal of Surface Science and Nanotechnology
5 (2007) 67
A. Ohiso, Y. Sugimoto, K. Mizuta, M. Abe, and S. Morita
Tip-induced local reconstruction on the Pb/Ge(111) surface using frequency modulation atomic force microscopy
Japnese Jounal of Applied Physics
46 (2007) 5582
A. Ohiso, Y. Sugimoto, M. Abe, and S. Morita
Atomic structure of Ge clusters on Si(111)-(7x7) by non-contact AFM
Nanotechnology
18 (2007) 084013
I. Yi, Y. Sugimoto, R. Nishi, M. Abe, and S. Morita
Direct observation of vacancy site of the iron silicide c(4x8) phase using frequency modulation atomic force microscopy
Nanotechnology
18 (2007) 084012
Y. Sugimoto, M. Abe, S. Konoshita, and S. Morita
Non-contact AFM observation of the (R3xR3) to (3x3) phase transition on Sn/Ge(111) and Sn/Si(111) surfaces
Applied Surface Science
253 (2007) 3072
I. Yi, R. Nishi, Y. Sugimoto, and S. Morita

paper 2006

Highly resolved non-contact atomic force microscopy images of the Sn/Si(111)-(2R3x2R3) surface
Nanotechnology
17 (2006) 4235
Y. Sugimoto, M. Abe, S. Hirayama, and S. Morita
Study on topographic images of Sn/Si(111)-(R3xR3) R30 surface by non-contact AFM
Surface Science
600 (2006) 3382
I. Yi, Y. Sugimoto, R. Nishi, and S. Morita
Discrimination of individual atoms on Ge/Si(111)-(7x7) intermixed surface
Surface Science
600 (2006) 2766
I. Yi, R. Nishi, Y. Sugimoto, M. Abe, Y. Sugawara, and S. Morita
Real topography, atomic relaxations, and short-range chemical interaction in atomic force microscopy: the case of the a-Sn/Si(111)-(R3xR3) R30 surface
Physical Review B
73 (2006) 205329
Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, S. Morita, R. Perez, and M. Abe
Site-specific Force Spectroscopy and Atom Interchange Manipulation at Room Temperature
e-Journal of Surface Science and Nanotechnology
4 (2006) 376
Y. Sugimoto, O. Custance, M. Abe, and S. Morita
Single atomic contact adhesion and dissipation in dynamic force microscopy
Physical Review Letters
96 (2006) 106101
N. Oyabu, P. Pou, Y. Sugimoto, P. Jelinek, M. Abe, S. Morita, R. Perez, and O. Custance

paper 2005

Atom tracking for reproducible force spectroscopy at room temperature with non-contact atomic force microscopy
Nanotechnology
16 (2005) 3029
M. Abe, Y. Sugimoto, O. Custance, and S. Morita
Room-temperature reproducible spatial force spectroscopy using atom-tracking technique
Applied Physics Letters
87 (2005) 173503
M. Abe, Y. Sugimoto, O. Custance, and S. Morita
Lateral manipulation of single atoms at semiconductor surfaces using atomic force microscopy
Nanotechnology
16 (2005) S112
N. Oyabu, Y. Sugimoto, M. Abe, O. Custance, and S. Morita
Imaging the restatom of the Ge(111)-c(2x8) surface with noncontact atomic force microscopy at room temperature
Nanotechnology
16 (2005) S68
M. Abe, Y. Sugimoto, and S. Morita
Atom inlays performed at room temperature using atomic force microscopy
Nature materials
4 (2005) 156
Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, O. Custance, and S. Morita
Mechanical Distinction and Manipulation of Atoms Based on Noncontact Atomic Force Microscopy
Applied Surface Science
241 (2005) 2
S. Morita, I. Yi, Y. Sugimoto, N. Oyabu, R. Nishi, O. Custance and M. Abe
A noncontact atomic force microscopy study of the Sn/Si(111) mosaic phase
Applied Surface Science
241 (2005) 23
Y. Sugimoto, M .Abe, K. Yoshimoto, O. Custance, I. Yi and S. Morita