国際会議発表

2010  2009  2008  2007  2006  2005  2004  2003  2002  2001  2000

2010年
Seizo Morita, "Toward Atom-by-Atom Creation and Evaluation of Composite Nanostructures at Room Temperature based on AFM" , IMRE(Institute of Materials Research and Engineering) Seminar on "Symposium on Singapore Scanning Probe Microscopy 2010 (SingSPM 2010)", 15 Dec, Wed, 8:30am-6:00pm, 2010, Singapore, Keynote Lecture 3, 14:20~15:00 including discussion, Abstracts of SingSPM 2010 p.13

Y. Sugimoto, Y. Nakajima, D. Sawada, K. Morita, M. Abe, and S. Morita, "Simultaneous AFM and STM measurements at room temperature" , The 18th International Colloquium on Scanning Probe Microscopy, 09.12.2010-11.12.2010, Atagawa Haitsu, Sizuoka, Japan:Oral Presentation,9:25-9:40, 10.12.2010, S5-3,p.11

K. Ueda, D. Sawada, Y. Sugimoto, M. Abe, S. Morita, "Simultaneous force and current mapping of the Si(111)-(7x7) surface by dynamic force microscopy" , The 18th International Colloquium on Scanning Probe Microscopy, 09.12.2010-11.12.2010, Atagawa Haitsu, Sizuoka, Japan:Poster Presentation,19:30-21:30, 10.12.2010, S4-2,p.39

M. Fukumoto, H. Tanaka, Y. Sugimoto, M. Abe, and S. Morita, "Force spectroscopy on hydrogen adsorbed Si(111)-(7x7) surface using dynamic force microscopy " , The 18th International Colloquium on Scanning Probe Microscopy, 09.12.2010-11.12.2010, Atagawa Haitsu, Sizuoka, Japan:Poster Presentation,19:30-21:30, 10.12.2010, S4-3,p.40

K. Morita, Y. Sugimoto, Y. Sasagawa, M. Abe, and S.Morita, "High spring constant cantilever for small amplitude dynamic force microscopy using an optical interferometer" , The 18th International Colloquium on Scanning Probe Microscopy, 09.12.2010-11.12.2010, Atagawa Haitsu, Sizuoka, Japan:Oral Presentation,9:10-9:25, 10.12.2010, S5-2,p.10

Seizo Morita, "Atomic force microscopy as a tool for room temperature atom identification and manipulation" , 18th International Vacuum Congress (IVC-18), the Beijing International Convention Center, Beijing, China, 23 - 27 August 2010, August 25, Wednesday Afternoon, Conference Plenary Lecture, Rm. 201ABC 17:15-18:00 CPL3-2

K. Nagashima, "Atomic resolution observation of soluble crystals in liquid by Frequency-Modulation AFM", 167 Committee satellite workshop on SPM, Ishikawa Ongakudo, Ishikawa, Japan, August 4-5, 2010, Invited talk:August 4, p.6-7.

D. Sawada, R. Takimoto, N. Hirayama, Y. Sugimoto, M. Abe, and S. Morita, "AFM/STM Simultaneous Imaging of the Si4 Tetramer", NC-AFM2010 (13th International Conference on Non-Contact Atomic Force Microscopy), Ishikawa Ongakudo, Kanazawa, Ishikawa, Japan, July 31 - August 4, 2010, Poster presentations: August 2, P2-1-10, p.112.

Y. Sugimoto, M. Abe, and S.Morita, "Measurement of atom hopping probability and interaction force during atom manipulation on the Si(111)-(7x7) surface", NC-AFM2010 13th International Conference on Non-Contact Atomic Force Microscopy, 29.07.2010-04.08.2010, Ishikawa Ongakudo, Kanazawa, Japan: Oral Presentation,14:40-15:00, 01.08.2010, Su-1440,p.9

H.J. Chung, Y. Sugimoto, A. Yurtsever, T. Namikawa, M. Abe, and S.Morita, "Impact of asymmetry tip structure on NC-AFM force mapping ", NC-AFM2010 (13th International Conference on Non-Contact Atomic Force Microscopy), Ishikawa Ongakudo, Kanazawa, Ishikawa, Japan, July 31 - August 4, 2010, Poster presentations: August 2, P2-1-16, p.136.

H. Tanaka, M. Fukumoto, Y. Sugimoto, M. Abe, and S.Morita, "Atom manipulation and force measurement by atomic force microscopy", NC-AFM2010 (13th International Conference on Non-Contact Atomic Force Microscopy), Ishikawa Ongakudo, Kanazawa, Ishikawa, Japan, July 31 - August 4, 2010, Poster presentations: August 2, P2-1-14, p.116.

D. Sawada, Y. Sugimoto, K. Morita, M. Abe, and S. Morita, "NC-AFM/STM Measurements on the Semiconductor Surface", iib2010 (the 13th International Conference on Intergranular and Interphase Boundaries in Materials), Shima, Mie, Japan, from June 27~July 2, 2010, Poster presentations: July 1, P-C37, p.205

K. Morita, Y. Sugimoto, Y. Sasagawa, M. Abe, and S.Morita, "Small-amplitude dynamic force microscopy using a quartz cantilever combined with an optical interferometer", NC-AFM2010 13th International Conference on Non-Contact Atomic Force Microscopy, 29.07.2010-04.08.2010, Ishikawa Ongakudo, Kanazawa, Japan: Oral Presentation,12:00-12:20, 01.08.2010, Su-1200,p.7

K.Morita, Y.Sasagawa, Y.Sugimoto, M.Abe and S.Morita "Small-amplitude dynamic force microscopy using a quartz cantilever and an optical interferometer", 2nd Global COE Student Conference on Innovative Electronic Topics SCIENT2010, 28.07.2010-29.07.2010, Icho Kaikan, Osaka University, Suita, Osaka, Japan: Poster Presentation, 28 July,15:00-18:00, Po-01, Conference Room B and C, p.50

K.Morita, Y.Sasagawa, Y.Sugimoto, M.Abe and S.Morita "High spring constant cantilever with metal tip for small amplitude NC-AFM operation", International Conference on Core Research and Engineering Science of Advanced Materials,30.05.2010-04.06.2010, Convention Center,Osaka University, Suita, Osaka, Japan: Poster Presentation, PSI-45,Poster session I(01.06.2010,13:40-14:40 and 19:00-20:00)

S.Morita, Y.Sugimoto, M.Abe, "Toward Atom-by-Atom Creation and Evaluation of Composite Nanostructures at RT based on AFM", SSSJ-A3 Foresight Joint Symposium on Nanomaterials and Nanostructures, July 5 (Mon)-7 (Wed), Koshiba Hall, University of Tokyo, Hongo Campus, Tokyo, Japan, July 6, 9:15-9:45, p.19

S.Morita, M.Abe, Y.Sugimoto, O.Custance, P.Pou, P.Jelinek, and R. P?rez, "Toward atom-by-atom creation and evaluation of composite nanostructures at room temperature" , iib2010 (the 13th International Conference on Intergranular and Interphase Boundaries in Materials), Shima, Mie, Japan, from June 27~July 2, 2010, Invited Talk: S10-34, June 30, 10:15-10:40, p.64.

S.Morita, Y.Sugimoto, M.Abe, "Toward Atom-by-Atom Nanostructuring of Composite Nanomaterials Based on Atomic Force Microscopy" , 6th Nanoscience and Nanotechnology Conference (Nano-TRVI) 15 - 18 June 2010, Golden Dolphin Hotel, Izmir ?esme, Turkey, Plenary Talk: June 17, 8:30-9:20, YUNUS HALL, p.145

A. Pratama, A. Yurtsever, Y. Sugimoto, M. Abe, and S. Morita, "Site-specific force spectroscopy on TiO2 (110) surface at low-temperature" 2nd Global COE International Symposium--Electronic Devices Innovation - EDIS2009-, 16:30-17:00, 14th January, 「Workshop on Applications of Atomic Force Microscopy」, WS4-O-1, p.147, 14th and 15th January 2010, Hotel Hankyu Expo-park, Suita, Osaka, Japan.

Daisuke Sawada, Yoshiaki Sugimoto, Ken-ichi Morita, Masayuki Abe and Seizo Morita, "Force and Tunneling Current Measurements on the Semiconductor Surface" 2nd Global COE International Symposium--Electronic Devices Innovation - EDIS2009-, 11:55-12:15, 15th January, 「Workshop on Applications of Atomic Force Microscopy」, WS4-O-2, p.156, 14th and 15th January 2010, Hotel Hankyu Expo-park, Suita, Osaka, Japan.

2009年
A. Pratama, Y. Ayhan, Y. Sugimoto, M. Abe, S. Morita, P. Jelinek, C. Gonzalez and R. Perez "Understanding the Mechanism of Different Contrast Modes on TiO2(110)-(1x1) Surface using nc-AFM at Low Temperature -- a Force Spectroscopic Measurement" 2009 MRS Fall Meeting-, November 30-December 4, 2009, The Hynes Convention Center, Boston, USA, December 2, Oral Session 422, 008.3, 9:00-9:15

H. Tanaka, A.Yurtsever, Y. Sugimoto, M. Abe, and S. Morita, "AFM/STM Simultaneous Measurement on TiO2(110) Surface" 2009 MRS Fall Meeting-, November 30-December 4, 2009, The Hynes Convention Center, Boston, USA, December 1, Poster Session 421, 007.9, 20:00-23:00

K.Morita, D.Sawada, Y.Sugimoto, M.Abe and S. Morita, "Force and Tunneling Current Measurements on the Semiconductor Surface" 2009 MRS Fall Meeting-, November 30-December 4 , 2009, The Hynes Convention Center, Boston, USA, December 1, Poster Session 421, 007.8, 20:00-23:00

M. Abe, D. Sawada, K. Morita, Y. Sugimoto and S. Morita, "Simultaneous Measurement of Force and Tunneling Current with Atomic Force Microscopy" 2009 MRS Fall Meeting-, November 30-December 4, 2009, The Hynes Convention Center, Boston, USA, November 30, Oral Session 415, 001.2, 9:00-9:15

Y. Sugimoto, O. Custance, M. Abe, and S. Morita, "Atom manipulation by Atomic force microscopy" 5th Handai Nanoscience and Nanotechnology International Symposium, Invited talk, Osaka university, Suita, Japan, September 1st, 2009

K. Nagashima, M. Abe, S. Morita, N. Oyabu, K. Kobayashi, H. Yamada, R. Murai, H. Adachi, K. Takano, H. Matsumura, S. Murakami, T. Inoue, Y. Mori, M. Ohta, R. Kokawa, "Molecular resolution investigation of tetragonal lysozyme(110) face in liquid by frequency-modulation AFM" Watching Biomolecules in Action Symposium & 2nd Kanazawa Bio-AFM Workshop, December 15-17, 2009, Osaka, Japan, December 15, Poster Session, 17:15-19:00, P-29, Abstracts book p.194-195.

R. Takimoto, D. Sawada, Y. Sugimoto, K. Morita, M. Abe, S. Morita, "NC-AFM/STM measurements on the Si(111)-(7×7) surface and the Ge(111)-c(2×8) surface" December 10-12, 2009, Atagawa, Shizuoka, Japan, December 10, Poster Session, 19:30-21:30, S4-3, Abstracts book p.36.

H. Tanaka, A. Pratama, A. Yurtsever, Y. Sugimoto, M. Abe, S. Morita, "Studying different type of image contrast on TiO2 (110) surface by using nc-AFM measurement" December 10-12, 2009, Atagawa, Shizuoka, Japan, December 10, Poster Session, 19:30-21:30, S4-4, Abstracts book p.37.

S. Yamane, K. Nagashima, M. Abe, S. Morita, "Atomic Resolution Imaging of alkali halide crystal in liquid by Frequency-Modulation AFM" December 10-12, 2009, Atagawa, Shizuoka, Japan, December 10, Poster Session, 19:30-21:30, S4-15, Abstracts book p.48.

K. Nagashima, M. Abe, S. Morita, N. Oyabu, K. Kobayashi, H. Yamada, R. Murai, H. Adachi, K. Takano, H. Matsumura, S. Murakami, T. Inoue, Y. Mori, M. Ohta, R. Kokawa, "Molecular resolution investigation of tetragonal lysozyme(110) face in liquid by frequency-modulation AFM" 17th International Colloquium on Scanning Probe Microscopy (ICSPM17), December 10-12, 2009, Atagawa, Shizuoka, Japan, December 10, Poster Session, 19:30-21:30, S4-35, Abstracts book p.68.

S.Morita, Y.Sugimoto, P.Pou, P.Jelinek, R. Perez, O.Custance and M.Abe, "Toward Atom-by-Atom Assembly of Composite Nanostructures Based on AFM" 7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09, December 6 (Sun)~11(Fri), 2009, The Westin Maui Resort & Spa, Maui, Hawaii, USA, 11:50-12:20, Dec.9, Invited, "SSSJ Special Session on SPM", Proc. of ALC'09, pp.385-387, 2009.

S.Morita, Y.Sugimoto, O.Custance, M.Abe, P.Pou, P.Jelinek and R. Perez: "Atom-by-Atom Nanostructuring of Composite Nanomaterials Based on AFM" The 4th International Symposium on Atomic Technologies (ISAT-4), November 18-19, 2009, Seaside Hotel MAIKO VILLA KOBE, Hyogo 655-0047, Japan, Wednesday, November 18, 15:50-16:10, Program and Book of Abstracts p.11.

Sho Yamane, Ken Nagashima, Masayuki Abe and Seizo Morita: "Atomic Resolution Imaging of KBr(100) cleaved surface in saturated solution by Frequency-Modulation AFM" The 4th International Symposium on Atomic Technologies (ISAT-4), November 18-19, 2009, Seaside Hotel MAIKO VILLA KOBE, Hyogo 655-0047, Japan, Thurday, November 19, 13:00-14:20, Program and Book of Abstracts p.34

R.Takimoto, D.Sawada, Y.Sugimoto, K.Morita, M.Abe and S.Morita: "NC-AFM/STM measurements on the Si(111)-(7x7) surface and the Ge(111)-c(2x8) surface" The 4th International Symposium on Atomic Technologies (ISAT-4), November 18-19, 2009, Seaside Hotel MAIKO VILLA KOBE, Hyogo 655-0047, Japan, Thurday, November 19, 13:00-14:20, Program and Book of Abstracts p.40

K. Nagashima, M. Abe, S. Morita, N. Oyabu, K. Kobayashi, H. Yamada, R.Murai, H. Adachi, K. Takano, H. Matsumura, S. Murakami, T. Inoue, Y.Mori, M. Ohta, R. Kokawa: "Molecular resolution investigation in liquid by frequency-modulation atomicforce microscopy" The 2nd "Interface Mineralogy", March 9-12, 2009, Miyagi, Japan, March 9, Poster Session, 19:30-21:30, #2, Abstract p.34.

Pratama A, Yurtsever A, Sugimoto Y, Abe M, and Morita S: "Probing the interaction of potassium (K) atoms on TiO2(110) surface by using non-contact atomic force microscopy (nc-AFM) at low temperature" 5th Handai Nanoscience and Nanotechnology International Symposium, Nano-Advanced Materials Design From Nano-structure to Nano-Functionality-, September 1-3, 2009, Icho Kaikan, Osaka University, Osaka, Japan, September 2, Poster Session 2, 13:15-14:30, P2-39

H. TANAKA, A.Yurtsever, Y. Sugimoto, M. Abe, and S. Morita: "Constant height AFM/STM imaging on TiO2(110) surface" 5th Handai Nanoscience and Nanotechnology International Symposium, Nano-Advanced Materials Design-From Nano-structure to Nano-Functionality-, September 1-3, 2009, Icho Kaikan, Osaka University, Osaka, Japan, September 2, Poster Session 2, 1315-14:30, P2-35

Daisuke Sawada, Yoshiaki Sugimoto, Ken-ichi Morita, Masayuki Abe and Seizo Morita: "NC-AFM/STM Measurements on the Si(111)-(7x7) Surface" 5th Handai Nanoscience and Nanotechnology International Symposium, Nano-Advanced Materials Design-From Nano-structure to Nano-Functionality-, September 1-3, 2009, Icho Kaikan, Osaka University, Osaka, Japan, September 2, Poster Session 2, 13:15-14:30, P2-34

Sho Yamane, Ken Nagashima, Masayuki Abe and Seizo Morita: "Atom Manipulation by Atomic Force Microscopy" 5th Handai Nanoscience and Nanotechnology International Symposium, Nano-Advanced Materials Design-From Nano-structure to Nano-Functionality-, September 1-3, 2009, Icho Kaikan, Osaka University, Osaka, Japan, September 1, Tuesday, Oral Session 4 (Nano-Fabrication and Nano-Characterization), O4-3, 17:05-17:25

Daisuke Sawada, Yoshiaki Sugimoto, Ken-ichi Morita, Masayuki Abe and Seizo Morita: "Simultaneous measurement of force and tunneling current" 12th International Conference on Noncontact Atomic Force Microscopy and Casimir 2009 Workshop, August 10-14, 2009, Yale University, New Haven, CT, USA, Tu-1200, August 11, Tuesday 12:00-12:20, 2009, p.51

A.Yurtsever, A.Pratama, Y.Sugimoto, M.Abe and S.Morita: "Site-specific force spectroscopy on TiO2(110) surface at low-temperature" 12th International Conference on Noncontact Atomic Force Microscopy and Casimir 2009 Workshop, August 10-14, 2009, Yale University, New Haven, CT, USA, We-0920, August 12, Wednesday 9:20-9:40, 2009, p.58

Daisuke Sawada, Yoshiaki Sugimoto, Ken-ichi Morita, Masayuki Abe and Seizo Morita: "Force and Tunneling Current Measurements on the Semiconductor Surface" 12th International Conference on Noncontact Atomic Force Microscopy and Casimir 2009 Workshop, August 10-14, 2009, Yale University, New Haven, CT, USA, P.I-01, August 11, Tuesday Poster Session I, 15:50-18:00, 2009, p.92

K.Nagashima, M.Abe, S.Morita, N.Oyabu, K.Kobayashi, H.Yamada, R.Murai, H.Adachi, K.Takano, H.Matsumura, S.Murakami, T.Inoue, Y.Mori, M.Ohta and R.Kokawa: "Molecular Resolution Investigation of Lysozyme Crystal in Liquid by Frequency-Modulation AFM" 12th International Conference on Noncontact Atomic Force Microscopy and Casimir 2009 Workshop, August 10-14, 2009, Yale University, New Haven, CT, USA, P.II-13, August 12, Wednesday Poster Session II, 15:50-18:00, 2009, p.141

Seizo Morita, Yoshiaki Sugimoto, Oscar Custance, Masayuki Abe, Pablo Pou, Pavel Jelinek, Ruben Perez: "Toward Atom-by-Atom Assembly of Complex Nanostructures Based on Atomic Force Microscopy" An local meeting of Czech nanosociety, 3 pm~4 pm, July 16, 2009, Institute of Physics, Academy of Sciences of the Czech Republic, Prague, Czech Republic

Seizo Morita, Yoshiaki Sugimoto, Oscar Custance, Masayuki Abe, Pablo Pou, Pavel Jelinek, Ruben Perez: "Toward Atom-by-Atom Assembly of Complex Nanostructures Based on Atomic Force Microscopy" Physikalisches Kolloquium ? Weekly colloquia SS09, Ort H34, Zeit16:15~17:15, 13 July, 2009 (eingeladen von Franz Giessibl), Physik, Universitat Regensburg, Germany

Takashi TERADO, Y. Sasagawa, Y. Sugimoto, M. Abe, and S. Morita : "Development of Atomic Force Microscopy Using Quartz Tuning Fork Operated in Ultra High Vacuum", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

K. Nagashima, M. Abe, S. Morita, N. Oyabu, K. Kobayashi, H. Yamada, R. Murai, H. Adachi, K. Takano, H. Matsumura, S. Murakami, T. Inoue, Y. Mori, M. Ohta, R. Kokawa, : "Molecular resolution investigation in liquid by frequency-modulation atomicforce microscopy"The 2nd "Interface Mineralogy", March 9-12, 2009, Miyagi, Japan, March 9, Poster Session,19:30-21:30, #2, Abstract p.34.

Arushi SATO, K. Ina, Y. Sugimoto, M. Abe, and S. Morita : "Optical Interferometer for Detection and Excitation of Cantilever Motion: A Study of Atomic Force Microscopy", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

Kenichi INA, A Sato, Y. Sugimoto, M. Abe, and S. Morita : "Sensitivity improvement of interferometer for NC-AFM", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

Yuki SASAGAWA, H.Hasegawa, Y.Sugimoto, M.Abe, S.Morita : "Investigation of excitation method for quartz tuning fork atomic force microscopy", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

Hideki TANAKA, A. Hirai, I. Yi, Y. Sugimoto, M. Abe, and S. Morita : "Observation of the metal oxide surface by scanning probe microscopy", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

Abdi PRATAMA, A. Yurtsever, Y. Sugimoto, and S. Morita : "High Resolution Imaging of TiO2 (110)-(1x1) Using Non-Contact AFM at Low Temperature", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

Makoto TAKEDA, M. Nagayasu, Y. Sugimoto, M. Abe, and S. Morita : "High-resolution imaging of CaF2 /Si (111) surface using atomic resolution NC-AFM", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

Yuki NAKAJIMA, Y. Sugimoto, M. Abe, and S. Morita : "Statistics of lateral atom manipulation by atomic force microscopy at room temperature", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

Hitomi HASEGAWA, Y. Sasagawa , Y. Sugimoto, M Abe, and S. Morita : "Investigation into small diameter metal tip for force sensor", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

Saeidifar SOMAYEH, Sugimoto Yoshiaki, Abe Masayuki, and Morita Seizo : "Deflection amplifier for tuning fork operated in ultra-high vacuum", 3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3), Thursday, March 5th-Friday, March 6th, 2009, Tokyo International Exchange Center, Tokyo, Japan, PP-2-58 , Thursday, March 5th-Friday, 2009

2008年
Y. Sugimoto : "Chemical identification and atom manipulation using atomic force microscopy", The Japanese Society of Microscopy 64th Scientific Synposium, Invited talk, Kyoto International Conference Center, Kyoto, Japan, May 21st, 2008

Y. Sugimoto, K. Miki, M. Abe, and S. Morita : "Statistics of Lateral Atom Manipulation by Atomic Force Microscopy at Room Temperature", The 16th International Colloquium on Scanning Probe Microscopy, Atagawa, December 11-13, 2008, S10-6 Dec.13 Sat. 11:55-12:10, Abstract (JSAP Catalog Number:092231) p.40.

D. Sawada, Y. Sugimoto, M. Abe, and S. Morita : "NC-AFM/STM Study on the Semiconductor Surface", The 16th International Colloquium on Scanning Probe Microscopy, Atagawa, December 11-13, 2008, Poster Session, S4-44 Dec.11 Thu. 19:30-21:30, Abstract (JSAP Catalog Number:092231) p.85.

Y. Sugimoto, T. Namikawa, K. Miki, M. Abe, and S. Morita : "Vertical and lateral force mapping by non-contact atomic force microscopy", International Symposium on Surface Science and Nanotechnology International Conference Center, Waseda University, Tokyo, Japan November 9-13, 2008 p41.

Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, and S. Morita : "Single atom manipulaiton at room temperature", 4th Handai Nanoscience and technology International Symposium, Suita, Japan, Sep.29 -Oct.1, 2008, O2-3.

A. Hirai, I. Yi, Y. Sugimoto, M. Abe and S. Morita : "Observation of the metal oxide surface by scanning probe microscopy", 4th Handai Nanoscience and technology International Symposium, Suita, Japan, Sep.29 -Oct.1, 2008, P2-32.

D. Sawada, Y. Sugimoto, M. Abe and S. Morita : "NC-AFM/STM measurements on the Ge(111)-c(2x8) Surface", 4th Handai Nanoscience and technology International Symposium, Suita, Japan, Sep.29-Oct.1, 2008, P2-36.

M. Nagayasu, Y. Seino, S. Morita : "Distinction of intermixed ionic atoms on insulating surface of (Ca,Sr)F2", 4th Handai Nanoscience and technology International Symposium, Suita, Japan, Sep.29-Oct.1, 2008, P2 -39.

Seizo Morita, Yoshiaki Sugimoto, Oscar Custance, Masayuki Abe, Pablo Pou, Pavel Jelinek and Ruben Perez : "Toward Atom-by-Atom Assembly of Composite Nanostructures Based on Atomic Force Microscopy", 21st International Microprocesses and Nanotechnology Conference (MNC 2008), October 27-30, 2008, JAL Resort Sea Hawk Hotel Fukuoka, Japan, Session Title.: Nano Fabrication I, Session Number : 29C-7-1, Session Time: 13:30-14:00, Room: Navis C (1F), Author’s Interview 15:20-15:35, Digest of Papers: pp.110-111.

Seizo Morita, Yoshiaki Sugimoto, Oscar Custance, Masayuki Abe, Pablo Pou, Pavel Jelinek and Ruben Perez : "Atomic Tool for Nanofabrication Based on Atomic Force Microscopy", 55th AVS International Symposium in Boston, MA, USA. Tuesday Morning, October 21, 2008, Nanometer-scale Science and Technology, Room: 311 - Session NS+NC-TuM, The Frontiers of Nanoscience, Moderator: M.C. Hersam, Northwestern University, NS+NC-TuM11, Albert Nerken Award Lecture 11:20-12:00 AM October 21, 2008

Y. Sugimoto, T. Namikawa, K. Miki, M. Abe, and S. Morita: "Vertical and lateral force mapping on the Si(111) -(7x7) surface by dynamic force microscopy", 11th International Conference on Non-contact Atomic Force Microscopy, September 15-19, Madrid, Spain, Tu-1020 (September 16, 10:20am-10:40am), Program book, p.28.

S. Sadewasser, O. Custance, Y. Sugimoto, M. Abe and S. Morita: "Distinct short-range electrostatic interaction on Si and substitutional Pb atoms at the Si(111) -(7x7) surface", 11th International Conference on Non-contact Atomic Force Microscopy, September 15-19, Madrid, Spain, Tu-1120 (September 16, 11:20am-11:40am), Program book, p.29.

P. Pou, Y. Sugimoto, O. Custance, P. Jelinek, M. Abe, S. Morita and R. Perez: "Unveiling the atomic processes during the manipulation of single atoms at semiconductor surfaces using the FM-AFM in the repulsive regime", 11th International Conference on Non-contact Atomic Force Microscopy, September 15-19, Madrid, Spain, Tu-1450 (September 16, 14:50-15:10), Program book, p.34.

S. Torbr?gge, O. Custance, S. Morita and M. Reichling: "Characterizing reactivity of water molecules on CeO2(111) using atomic force microscopy", 11th International Conference on Non-contact Atomic Force Microscopy, September 15-19, Madrid, Spain, We-0900 (September 17, 9:00am-9:20am), Program book, p.39.

O. Custance, Y. Sugimoto, M. Abe and S. Morita: "Force spectroscopy using cantilever higher flexural modes", 11th International Conference on Non-contact Atomic Force Microscopy, September 15-19, Madrid, Spain, Fr-1140 (September 19, 11:40am-12:00am), Program book, p.73.

M. Abe, Y. Sugimoto, K. Miki, T. Namikawa and S. Morita: "Imaging and Mapping for discriminating atom species using Non-contact Atomic Force Microscopy", 11th International Conference on Non-contact Atomic Force Microscopy, September 15-19, Madrid, Spain, Fr-1200 (September 19, 12:00am-12:20am), Program book, p.74.

Seizo Morita: "State-of-the-Art and Future Prospects of Atomic Force Microscopy with Atomic Resolution", the 2008 International Conference on Nanoscience+Technology (ICN+T 2008), July 20?25, 2008, Keystone Resort and Conference Center, Colorado, USA, PLENARY LECTURE, PS-WeM1 (July 23, 8:00 AM-8:50AM), Technical Program & Abstracts of ICN+T 2008 p.133.

Seizo Morita: "Atom-by-Atom Bottom-up Nanostructuring System Based on Atomic Force Microscopy", Osaka University GCOE Summer Seminar Program for Electronic Devices, Academic Melting-Pot 2008 (AMP2008), July 7 - August 1, 2008 , Thu. 10 July Lectures, Global Seminar 1, Audio-Visual Hall, Suita Branch Library, Suita Campus, Osaka University, 14:00 - 15:00 P.M.

Seizo Morita, Yoshiaki Sugimoto, ?scar Custance and Masayuki Abe : "Atom-by-Atom Chemical Identification and Following Manipulation on Semiconductor Surfaces Toward Nanostructuring at Room Temperature ", the 14th International Conference on Solid Films and Surfaces (ICSFS-14), Trinity College Dublin, June 29-July 4, 2008, PLENARY LECTURE, Tue-PL-2 13:45-14:25, Tuesday 1 July 2008, Programme of ICSFS-14 p.91.

S. Iwasaki, A. Hirai, Y. Sugimoto, M. Abe, and S. Morita: "Imaging of the Si clusters on the Si(111)-(7x7) surface by using NC-AFM", International Journal of Advanced Microscopy and Theoretical Calculations (AMTC Letters, ISSN 1882-9465) vol.1 pp.82-83, June 30 14:50-16:20 発表番号:028, 2008..

D. Sawada, T. Namikawa, M. Hiragaki, Y. Sugimoto, M. Abe, and S. Morita: "NC-AFM study of phosphorous/Si(001)2x1 surface", International Journal of Advanced Microscopy and Theoretical Calculations (AMTC Letters, ISSN 1882-9465) vol.1 pp.84-85, June 29 15:00-16:30 発表番号:029, 2008..

Y.Sugimoto, "Single atom identification and manipulation using atomic force microscopy", JST-DFG Workshop on Nano-electronics, Aachen,Germany, March 5-7, 2008. (invited)

D.Sawada, T.Namikawa, M.Hiragaki, Y.Sugimoto, M.Abe and S.Morita, "High spatial resolution imaging on Si(001)-(2x1) and P/Si(001)-(2x1)surfaces using atomic force microscopy", 1st Global COE Intl. Symposium Electronic Devices Innovation, Suita, Japan, Jan. 21-22, 2008, p.105.

A.Fujii, V.Kittichungchit, M.Watanabe, M.Abe, M.Yoshimura and M.Ozaki, "Development of Advanced High-Performance Organic Photovoltaic Device", 1st Global COE Intl. Symposium Electronic Devices Innovation, Suita, Japan, Jan. 21-22, 2008, p.153.

S.Honda, H.Aoki, T.Matsuoka, M.Abe, M.Morifuji, M.Katayama and K.Taniguchi, "Research and Development of Smart Integrated Sensing System", 1st Global COE Intl. Symposium Electronic Devices Innovation, Suita, Japan, Jan. 21-22, 2008, p.175.

T.Maki, Y.Nakatani, X.Kong, A.Yutani and H.Itozaki, M.Abe and T.Matsuoka, "Observation of grain-boundary on bicrystal", Suita, Japan, 1st Global COE Intl. Symposium Electronic Devices Innovation, Jan.21-22, 2008, p.179.

Seizo Morita, "Atom-by-Atom Chemical Coordination Effect Observed in Non-Contact AFM Topography", Workshop on Advanced Dynamic Force Microscopy, Time: 13:30 - 17:30, March 3rd. (Mon), 2008, Place: Kyoto University Rohm Plaza, 3F Seminar Room, Invited Talk: 14:30 - 15:15, This workshop is sponsored by Center of Excellence (COE) for Education and Research on Photonics and Electronics Science amd Engineering, Kyoto University. It is also cosponsored by Advanced Research Institute of Nanoscale Science and Engineering, Kyoto University.

2007年
Y.Sugimoto, M.Abe, O.Custance, S.Morita, P.Pou, P.Jelinek and R.Perez, "Room Temperature Atomic Manipulation Using Dynamic Force Microscopy", The 15th International Colloquium on Scanning Probe Microscopy, Atagawa, December 6-8, 2007, S7-1(Invite) Dec.7 Fri. 13:15-13:50, Abstract (JSAP Catalog Number:072251) p.16.

K.Miki, T.Namikawa, Y.Sugimoto, M.Abe and S.Morita, "Atom Manipulation on the Sn Deposited Si(111)-(7x7) Surface Using Atomic Force Microscopy", The 15th International Colloquium on Scanning Probe Microscopy, Atagawa, December 6-8, 2007, Poster Session S4-20 Dec.6 Thu. 19:00-21:30, Abstract (JSAP Catalog Number:072251) p.56.

T.Namikawa, K.Miki, Y.Sugimoto, O.Custance, M.Abe and S.Morita, "Atom Identification by Dynamic Force Mapping", The 15th International Colloquium on Scanning Probe Microscopy, Atagawa, December 6-8, 2007, Poster Session S4-21 Dec.6 Thu. 19:00-21:30, Abstract (JSAP Catalog Number:072251) p.57.

S.Iwasaki, A.Hirai, Y.Sugimoto, M.Abe and S.Morita, "NC-AFM Investigation of the Si Cluster on the Si(111)-(7x7) Surface", The 15th International Colloquium on Scanning Probe Microscopy, Atagawa, December 6-8, 2007, Poster Session S4-22 Dec.6 Thu. 19:00-21:30, Abstract (JSAP Catalog Number:072251) p.58.

D.Sawada, T.Namikawa, M.Hiragaki, Y.Sugimoto, M.Abe and S.Morita, "AFM Observation of P/Si(001)-(2x1) Surface", The 15th International Colloquium on Scanning Probe Microscopy, Atagawa, December 6-8, 2007, Poster Session S4-23 Dec.6 Thu. 19:00-21:30, Abstract (JSAP Catalog Number:072251) p.59.

Seizo Morita, Yoshiaki Sugimoto, Oscar Custance, Masayuki Abe, Pablo Pou, Pavel Jelinek and Ruben Perez, "Atom-by-Atom Chemical Identification and Following Atom Manipulation", 2nd International Workshop on Materials Science and Nano-Engineering organized by 21st Century COE Program at Osaka University "Core Research and Advanced Education Center for Materials Science and Nano-Engineering", 1-5 December, 2007, Awaji Yumebutai International Conference Center, Awaji, Japan, B-14, 10:30-11:00, 5 December, 2007, ABSTRACT BOOKLET p.35

Y.Seino, M.Nagayasu and S.Morita, "Distinction of individual ionic atom species on (Ca,Sr)F2/Si(111) surface", 2nd International Workshop on Materials Science and Nano-Engineering organized by 21st Century COE Program at Osaka University "Core Research and Advanced Education Center for Materials Science and Nano-Engineering", 1-5 December, 2007, Awaji Yumebutai International Conference Center, Awaji, Japan, PB-01 (Poster), 12:15-15:00, 4 December & 12:50-14:30, 5 December, 2007, ABSTRACT BOOKLET p.68

M.Hiragaki, D.Sawada, Y.Sugimoto, M.Abe and S.Morita, "Force spectroscopy using human interface", 2nd International Workshop on Materials Science and Nano-Engineering organized by 21st Century COE Program at Osaka University "Core Research and Advanced Education Center for Materials Science and Nano-Engineering", 1-5 December, 2007, Awaji Yumebutai International Conference Center, Awaji, Japan, PB-02 (Poster), 12:15-15:00, 4 December & 12:50-14:30, 5 December, 2007, ABSTRACT BOOKLET p.69

A.Ohiso, M.Hiragaki, K.Mizuta, Y.Sugimoto, M.Abe and S.Morita, "Non-Contact AFM observation of the "Chemical Coordination Effect" of Pb/Si(111)-(√3x√3) Mosaic Phase", 2nd International Workshop on Materials Science and Nano-Engineering organized by 21st Century COE Program at Osaka University "Core Research and Advanced Education Center for Materials Science and Nano-Engineering", 1-5 December, 2007, Awaji Yumebutai International Conference Center, Awaji, Japan, PB-03 (Poster), 12:15-15:00, 4 December & 12:50-14:30, 5 December, 2007, ABSTRACT BOOKLET p.70

T.Namikawa, K.Miki, Y.Sugimoto, O.Custance, M.Abe and S.Morita, "Potential mapping using non-contact atomic force microscopy", 2nd International Workshop on Materials Science and Nano-Engineering organized by 21st Century COE Program at Osaka University "Core Research and Advanced Education Center for Materials Science and Nano-Engineering", 1-5 December, 2007, Awaji Yumebutai International Conference Center, Awaji, Japan, PB-04 (Poster), 12:15-15:00, 4 December & 12:50-14:30, 5 December, 2007, ABSTRACT BOOKLET p.71

Y.Murai, R.Omae, Y.Sugimoto, M.Abe and S.Morita, "Atomic force microscopy using quartz tuning fork in air", 2nd International Workshop on Materials Science and Nano-Engineering organized by 21st Century COE Program at Osaka University "Core Research and Advanced Education Center for Materials Science and Nano-Engineering", 1-5 December, 2007, Awaji Yumebutai International Conference Center, Awaji, Japan, PB-05 (Poster), 12:15-15:00, 4 December & 12:50-14:30, 5 December, 2007, ABSTRACT BOOKLET p.72

Y.Yamada, S.Sadewasser, Y.Sugimoto, O.Custance and S.Morita, "Characterization of the electrostatic interaction on substitutional Pb atoms at the Si(111)-(7x7) surface using low temperature dynamic force microscopy", 2nd International Workshop on Materials Science and Nano-Engineering organized by 21st Century COE Program at Osaka University "Core Research and Advanced Education Center for Materials Science and Nano-Engineering", 1-5 December, 2007, Awaji Yumebutai International Conference Center, Awaji, Japan, PB-06 (Poster), 12:15-15:00, 4 December & 12:50-14:30, 5 December, 2007, ABSTRACT BOOKLET p.73

D.Sawada, T.Namikawa, M.Hiragaki, Y.Sugimoto, M.Abe and S.Morita, "Atomic force microscopy study of P/Si(001)-(2x1) surface", 2nd International Workshop on Materials Science and Nano-Engineering organized by 21st Century COE Program at Osaka University "Core Research and Advanced Education Center for Materials Science and Nano-Engineering", 1-5 December, 2007, Awaji Yumebutai International Conference Center, Awaji, Japan, PB-07 (Poster), 12:15-15:00, 4 December & 12:50-14:30, 5 December, 2007, ABSTRACT BOOKLET p.74

Y.Sugimoto, P.Pou, M.Abe, P.Jelinek, O.Custance, R.Perez and S.Morita, "Atom-by-Atom Chemical Identification and Following Atom Manipulation Toward Cound Nanostructuring", The 9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-9), November 11-15, 2007, Komaba Research Campus of The University of Tokyo, Tokyo, Japan, Nov.12 Room A 16:00-16:30 12Ap2-1,2, Program and Abstracts p.64

Seizo Morita, "Principles and State of the Art of Atomic Force Microscopy", 6th Int.Symp.Atomic Level Characterizations for New Materials and Devices '07 (ALC07), Oct.28 (Sun)~Nov.2 (Fri), 2007, Kanazawa Art Hall, Ishikawa, Japan, Tutorial (Invited) 16:30~17:30 SuA-4, Oct.28, 2007, Program&Abstract p.4

Yoshiaki Sugimoto, Masayuki Abe, Oscar Custance, Seizo Morita, Pavel Jelinek, Pablo Pou and Ruben Perez, "Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy", Second International Symposium on Atomic Technologies (ISAT-2), October 1-2, 2007, Awaji Yumebutai International Conference Center, Yumebutai, Awaji City, Hyogo, Japan, October 1, 13:30-15:00 Poster Session, p-7

T.Namikawa, Y.Sugimoto, O.Custance, M.Abe and S.Morita, "Tip-surface interaction potential mapping at room-temperature using non-contact atomic force microscopy", Second International Symposium on Atomic Technologies (ISAT-2), October 1-2, 2007, Awaji Yumebutai International Conference Center, Yumebutai, Awaji City, Hyogo, Japan, October 1, 13:30-15:00 Poster Session, p-8

Y.Yamada, S.Sadewasser, Y.Sugimoto, O.Custance and S.Morita, "Characterization of the electrostatic interaction on substitutional Pb atoms at the Si(111)-(7x7) surface using low temperature dynamic force microscopy", Second International Symposium on Atomic Technologies (ISAT-2), October 1-2, 2007, Awaji Yumebutai International Conference Center, Yumebutai, Awaji City, Hyogo, Japan, October 1, 13:30-15:00 Poster Session, p-9

A.Ohiso, M.Hiragaki, K.Mizuta, Y.Sugimoto, M.Abe and S.Morita, "Non-contact atomic force microscopy investigation of the Pb/Si(111)-(√3×√3) mosaic phase", Second International Symposium on Atomic Technologies (ISAT-2), October 1-2, 2007, Awaji Yumebutai International Conference Center, Yumebutai, Awaji City, Hyogo, Japan, October 1, 13:30-15:00 Poster Session, p-11

Y.Seino, M.Nagayasu and S.Morita, "Distribution of individual ionic atom species on (Ca,Sr)F2/Si(111) surface", Second International Symposium on Atomic Technologies (ISAT-2), October 1-2, 2007, Awaji Yumebutai International Conference Center, Yumebutai, Awaji City, Hyogo, Japan, October 1, 13:30-15:00 Poster Session, p-25

Y. Murai, R.Omae, Y. Sugimoto, M. Abe and Seizo Morita, "Atomic force microscopy using quartz tuning fork in air", Second International Symposium on Atomic Technologies (ISAT-2), October 1-2, 2007, Awaji Yumebutai International Conference Center, Yumebutai, Awaji City, Hyogo, Japan, October 1, 13:30-15:00 Poster Session, p-16

Yoshiaki Sugimoto, Masayuki Abe, Oscar Custance, Seizo Morita, Pavel Jelinek, Pablo Pou and Ruben Perez, "Room temperature lateral atom manipulations on semiconductors using dynamic force microscopy", Handai Nanoscience and Nanotechnology International Symposium 2007, September 26-28, 2007, Sigma Hall, Osaka University, September 27, Poster 2, P-1-7, 13:30-14:30

Y.Yamada, S.Sadewasser, Y.Sugimoto, O.Custance and S.Morita, "Characterization of the electrostatic interaction on substitutional Pb atoms at the Si(111)-(7x7) surface using low temperature dynamic force microscopy", Handai Nanoscience and Nanotechnology International Symposium 2007, September 26-28, 2007, Sigma Hall, Osaka University, September 27, Poster 2, P-1-10, 13:30-14:30

Y.Seino, M.Nagayasu and S.Morita, "Distribution of ionic chemical species on the surface of (Ca,Sr)F2/Si(111)", Handai Nanoscience and Nanotechnology International Symposium 2007, September 26-28, 2007, Sigma Hall, Osaka University, September 27, Poster 2, P-1-11, 13:30-14:30

T.Namikawa, Y.Sugimoto, O.Custance, M.Abe and S.Morita, "Potential mapping at room-temperature using dynamic force microscopy", Handai Nanoscience and Nanotechnology International Symposium 2007, September 26-28, 2007, Sigma Hall, Osaka University, September 27, Poster 2, P-1-13, 13:30-14:30

A.Ohiso, M.Hiragaki, K.Mizuta, Y.Sugimoto, M.Abe and S.Morita, "Surrounding atoms effects on the Pb/Si(111)-(√3×√3) mosaic phase", Handai Nanoscience and Nanotechnology International Symposium 2007, September 26-28, 2007, Sigma Hall, Osaka University, September 27, Poster 2, P-1-14, 13:30-14:30

Y. Murai, R.Omae, Y. Sugimoto, M. Abe and Seizo Morita, "Atomic force microscopy using quartz tuning fork in air", Handai Nanoscience and Nanotechnology International Symposium 2007, September 26-28, 2007, Sigma Hall, Osaka University, September 27, Poster 2, P-1-17, 13:30-14:30

Stefan Torbrugge, Michael Reichling, Seizo Morita and Oscar Custance, "Evidence of Subsurface Oxygen Vacancy Ordering on Reduced CeO2(111)", The 10th International Conference on Non-Contact Atomic Force Microscopy, 16-20 September, 2007, Antalya, Turkey, 10:00-10:20, September 18, 2007

Yusaku Yamada, S.Sadewasser, Y.Sugimoto, O.Custance and S.Morita, "Characterization of the electrostatic interaction on substitutional Pb atoms at the Si(111)-(7x7) surface using low temperature dynamic force microscopy", The 10th International Conference on Non-Contact Atomic Force Microscopy, 16-20 September, 2007, Antalya, Turkey, Poster II, P38, 17:20-19:30, September 18, 2007

Masahiro Ohta, K.Watanabe, R.Kokawa, K.Kobayashi, H.Yamada, M.Abe, S.Morita, M.Tomitori, H.Onishi and T.Arai, "Investigations of Organic Molecules by Frequency Modulation Atomic Force Microscopy in Air or Liquid", The 10th International Conference on Non-Contact Atomic Force Microscopy, 16-20 September, 2007, Antalya, Turkey, Poster II, P44, 17:20-19:30, September 18, 2007

Noriaki Oyabu, M.Ohta, K.Watanabe, R.Kokawa, K.Kimura, K.Kobayashi, H.Yamada, M.Abe and S.Morita, "Development of Low-thermal Drift FM-AFM Working in Air/Liquid Environments", The 10th International Conference on Non-Contact Atomic Force Microscopy, 16-20 September, 2007, Antalya, Turkey, Poster II, P43, 17:20-19:30, September 18, 2007

Oscar Custance, " Chemical identification of individual surface atoms using dynamic force microscopy", Trends in Nanotechnology (TNT 2007) International Conference, San Sebastian (Spain) 3-7 September, 2007, Keynote talk, Tuesday, 4 , September, 2007, 15:00-15:30

Seizo Morita, Yoshiaki Sugimoto, Oscar Custance, and Masayuki Abe, "Toward atom-by-atom assembly of complex nanostructures at room temperature based on AFM", The 10th Asia Pacific Physics Conference (APPC10), 21-24 August 2007, POSCO International Center, POSTECH, Pohang, Korea,, Ac5 16:00-17:45 August, 2007, Condensed Matter Physics 5 (Atomic-scale phenomena on surface), 16:00-16:30 (Invited), Handbook & Abstracts p.74

Yoshiaki Sugimoto, "Atomic manipulation using dynamic force microscopy", Workshop on atomic/molecular manipulation and spectroscopy using scanning probe techniques, August 1~2, 2007, Icho Kaikan, Suita Campus, Osaka University, Organized by The 21st Century COE Program "Core Research and Advanced Education Center for Materials Science and Nano Engineering", 16:00-16:30 August 1, 2007

Oscar Custance, "Force spectroscopy and single atom chemical identification", Workshop on atomic/molecular manipulation and spectroscopy using scanning probe techniques, August 1~2, 2007, Icho Kaikan, Suita Campus, Osaka University, Organized by The 21st Century COE Program "Core Research and Advanced Education Center for Materials Science and Nano Engineering", 17:00-17:30 August 2, 2007

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Ryuji Nishi, Insook Yi, Yoshihide Seino, Oscar Custance, Masayuki Abe, Pablo Pou, Pavel Jelinek, and Ruben Perez, "Mechanical Atom Identification and Following Atom Manipulation for Assembling Compound Nanostructure", ICYS-ICMR Summer School on Nanomaterials 2007, NIMS Sengen-site,Tsukuba, Japan, July 23 (Mon)-28 (Sat), 2007, Lecturer, Lecture 16, 10:30-11:45, July 28 (Sat) 2007

M. Abe, Y. Sugimoto, O. Custance, and S. Morita: "Drift-compensated dataacquisition performed at room temperature with frequency modulation atomicforce microscopy", 17th International Vacuum Conference, July 2-6 2007,Stockholm, Sweden (NSP1-76)

Y.Sugimoto, P.Jelinek, P.Pou, O.Custance, M.Abe, R.Perez, S.Morita, "Mechanical Atom Identification and Following Atom Manipulation for Assembling Compound Nanostructure", International Conference on Materials for Advanced Technologies (ICMAT) 2007, 1-6 July 2007, Singapore, Symposium G - SPM in materials research, a keynote speaker, 45 min., Mon, 2 July 2007, 14:30 - 15:15, Abstract Booklet of Symposium G, pp.7-8

S. Morita, " Chemical identification of single atoms and following atom manipulation for assembling compound nanostructures", the International Nanoscience Symposium, Universitaet Hamburg, Hamburg, Germany, May 30 - June 1, 2007, Lecture 5/31 14:00-14:45, Session Chair on Friday, 1.6.07 for the second part of the morning session

Y. Sugimoto, M. Abe, O. Custance and S. Morita, "Atom manipulation at room temperature using AFM", in First International Symposium on Atomic Technology(ISAT-2007), Tsukuba, Japan, 16-17 March (2007)

R. Nishi, M. Hiragaki, D. Miyagawa, H. Etou, Y. Seino, Insook Yi and S. Morita, "Lateral manipulation of single defect on KCl(100) surface", in First International Symposium on Atomic Technology(ISAT-2007), Tsukuba, Japan, March 16-17, (2007)

Atsushi Ishiyama, Olli Pakarinen, Adam S. Foster, Noriaki Oyabu, Y. Yamada, Masayuki Abe, Oscar Custance, and Seizo Morita, "High-resolution imaging and manipulation on KBr (100) at low temperature", in First International Symposium on Atomic Technology(ISAT-2007), Tsukuba, Japan, March 16-17, (2007)

2006年
Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S. Morita and O. Custance: "Single-atom chemical identification using AFM", 14th International Colloquium on Scanning Probe Microscopy (ICSPM14), December 7-9, 2006 Atagawa Heights, Japan. organized by The Japan Society of Applied Physics, 7-Dec (Thu) Session 1 (14:05-15:35) 15:20-15:35 S1-4

A.Ohiso, K.Mizuta, M.Hiragaki, Y.Sugimoto, M Abe and S Morita: "Tip-induced diffusion at the Ge(111)-c(2x8) surface", 14th International Colloquium on Scanning Probe Microscopy (ICSPM14), December 7-9, 2006 Atagawa Heights, Japan. organized by The Japan Society of Applied Physics, 7-Dec (Thu), 20:00-21:30 Session 4-- Poster Session --, S4-10p

Y. Sugimoto, M. Abe, O. Custance and S. Morita: "AFM based atomic manipulation at room temperature", 14th International Colloquium on Scanning Probe Microscopy (ICSPM14), December 7-9, 2006 Atagawa Heights, Japan. organized by The Japan Society of Applied Physics, 7-Dec (Thu), 20:00-21:30 Session 4-- Poster Session --, S4-65p

Y.Sugimoto, P.Pou, M.Abe, P.Jelinek, S.Morita, R.Pérez and O.Custance: "Atomic Manipulation and Chemical Identification of Single Atoms Using Dynamic Force Microscopy", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, 9:30-10:00, O-1-1, am Invited Paper

P.Pou,Y.Sugimoto, P.Jelinek, M.Abe, S.Morita, O.Custance and R.Pérez: "Chemical Force and Tip-surface Elasticity: Understanding Single-atom Manipulation in Atomic Resolution Dynamic Force Microscopy", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, 10:00-10:30, O-1-2, am Invited Paper

Y.Seino, S.Yoshikawa and S.Morita: "Distinction of Individual Ionic Atoms on the Surface of (Ca, Sr)F2/Si(111)", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, Poster Session I (16:00 - 17:30 Monday, 20 Nov.) P-1-1

R. Nishi, D. Miyagawa, H. Etou, Y. Seino, I.Yi and S. Morita: "Lateral manipulation of atomic defect on alkali halide crystal surface", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, Poster Session I (16:00 - 17:30 Monday, 20 Nov.) P-1-2

Y. Sugimoto, M. Abe, O. Custance, S. Morita, P. Pou, P. Jelinek and R. Perez: "Single atom manipulation at room temperature using AFM", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, Poster Session I (16:00 - 17:30 Monday, 20 Nov.) P-1-3

A.Ohiso, K.Mizuta, M.Hiragaki, Y.Sugimoto, M.Abe and S.Morita: "NC-AFM observation of (1x1) and (√3×√3) phases of Pb/Si(111) Surface", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, Poster Session I (16:00 - 17:30 Monday, 20 Nov.) P-1-4

S.Yoshikawa, Y.Seino and S.Morita: "Simultaneous NC-AFM imaging of SrF2 and Si (111) surfaces", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, Poster Session I (16:00 - 17:30 Monday, 20 Nov.) P-1-5

T. Namikawa, Y. Sugimoto, K. Morita, O. Custance, M. Abe and S. Morita: "Tip-surface interaction potential mapping at room-temperature using noncontact atomic force microscopy", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, Poster Session I (16:00 - 17:30 Monday, 20 Nov.) P-1-6

I.Yi, Y.Sugimoto, R.Nishi, M.Abe and S.Morita: "NC-AFM study on atomic structure of Ge clusters on Si(111)-(7×7)", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, Poster Session I (16:00 - 17:30 Monday, 20 Nov.) P-1-7

A.Ishiyama, O.Pakarinen, A.S. Foster, N.Oyabu, Y.Yamada, M.Abe, O.Custance and S.Morita: "High-resolution imaging and manipulation on KBr(100) at low temperature", Handai Nanoscience and Nanotechnolog International Symposium 2006, Nov.20-22, 2006, Nakanoshima Center, Osaka University, Japan, Nov.20 Monday, Poster Session I (16:00 - 17:30 Monday, 20 Nov.) P-1-8

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Ryuji Nishi, Insook Yi, Yoshihide Seino, Oscar Custance and M.Abe, Pablo Pou, Pavel Jelinek, and Rub?n P?rez: "Site-Specific Force Spectroscopy and Following Artificial Nanostructuring", AVS-53rd, Nov 12-17, 2006, Moscone West Convention Center, San Francisco, CA, USA, Tuesday, November 14, 8:00 -12:20, Nanoscale Manipulation and Assembly, Room 2020, NS2-TuM5 9:20am-10:00am Invited Paper

O.H.Pakarinen, A.Ishiyama, A.S.Foster, N.Oyabu, M.Abe, O.Custance, R.M.Nieminen and S.Morita: "Chemical Specifity and Defect Characterization on MgO(001)", AVS-53rd, Nov 12-17, 2006, Moscone West Convention Center, San Francisco, CA, USA, Monday, November 13, 8:00 -12:00, Nanoscale Science andTechnology, Room 2016, NS-MoM3 8:40am-9:00am

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Ryuji Nishi, Insook Yi, Yoshihide Seino, Oscar Custance and M.Abe: "Mechanical Atom Identification and Following Artificial Nanostructuring", The University of Tokyo International Symposium and The tenth ISSP International Symposium (ISSP-10) on Nanoscience at Surfaces, Oct 9-13, 2006, Kashiwa, Chiba, Japan, October 13, 2006, D-1 9:00-9:30

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Ryuji Nishi, Insook Yi, Yoshihide Seino, Oscar Custance, M.Abe, Pablo Pou, Pavel Jelinek and Ruben Perez: "Artificial Nanostructuring Using Mechanical Atom Manipulation", IMC16 , Sept 3-8, 2006, Sapporo, Japan, Monday, September 04, 2006, 10:00 - 18:00, Rm102 I-6, SPM (Scanning probe microscopy), Chair:Dr.D.Fujita, Prof.R.Wiesendanger, 4H_p4 15:45 -16:15 Invited Talk

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Ryuji Nishi, Insook Yi, Yoshihide Seino, Oscar Custance, M.Abe, Pablo Pou, Pavel Jelinek and Ruben Perez: "Atom-by-Atom Force Spectroscopy and Bottom-Up Nanostructuring", ICN&T2006 (STM06&Nano9) , July 30-Aug 4, 2006,Basel, Switzerland, Tuesday, August 01, 2006, 16:30 - 18:30 Sydney, SPM/nc-AFM, Chair: Prof.R.Bennewitz (Montreal, CA), 230, 16:30 - 17:00 Invited Talk

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Ryuji Nishi, Insook Yi, Yoshihide Seino, Oscar Custance, M.Abe, Pablo Pou, Pavel Jelinek and Ruben Perez: "Mechanical Atom Identification and Following Atom Manipulation", The 4th International Conference on Scanning Probe Microscopy SPS’06, July23-26, 2006, Hamburg, Germany, Monday, July 24, Lecture Hall 1 "Wolfgang Pauli"14:00-14:40 Invited Talk

Kenichi Morita, Takashi Namikawa, Yoshiaki Sugimoto, Óscar Custance, Masayuki Abe and Seizo Morita: "Feed-forward acquisition mode for imaging, force spectroscopy and potential mapping at room temperature", (July 18, Tu-7) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Yoshiaki Sugimoto, Masayuki Abe, Takashi Namikawa, Óscar Custance, Seizo Morita, Pablo Pou, Pavel Jelinek and Rubén Pérez: "Force spectroscopy: a tool for single-atom chemical recognition at semiconductors", (July 19, We-4) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Pablo Pou, Pavel Jelinek, Rubén Pérez, Yoshiaki Sugimoto, Masayuki Abe, Óscar Custance and Seizo Morita: "Chemical force and tip-surface elasticity: understanding the short-range force curves in atomic resolution dynamic force microscopy", (July 19, We-5) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Y.Seino, S.Yoshikawa and S.Morita: "Distinction of intermixed ionic atoms on insulating surface of (Ca,Sr)F2", (July 19, We-6) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

O.H.Pakarinen, A.Ishiyama, A.S.Foster, N.Oyabu, M.Abe, O.Custance, R.M.Nieminen and S.Morita: "Chemical specificity and defect characterization on MgO(001)", (July 19, We-7) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Yoshiaki Sugimoto, Masayuki Abe, Óscar Custance, Seizo Morita, Pablo Pou, Pavel Jelinek and Rubén Pérez: "Interchange vertical manipulation of single atoms and nanostructuring", (July 20, Th-1) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Pavel Jelinek, Pablo Pou, Rubén Pérez, Yoshiaki Sugimoto, Masayuki Abe, Óscar Custance and Seizo Morita: "Atomic pathways during the manipulation of single atoms at semiconductor surfaces using NC-AFM", (July 20, Th-2) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

T.Namikawa, Y.Sugimoto, K.Morita, O.Custance, M.Abe and S.Morita: "Tip-surface interaction potential mapping at room-temperature using non-contact atomic force microscopy", (July 17, P1-29) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Shota Yoshikawa, Yoshihide Seino and Seizo Morita: "Simultaneous NC-AFM imaging of SrF2 and Si (111) surfaces", (July 18, P2-3) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Atsushi Ishiyama, Olli Pakarinen, Adam S.Foster, Noriaki Oyabu, Y.Yamada, Masayuki Abe, Óscar Custance and Seizo Morita: "High-resolution imaging and manipulation on KBr(100) at low temperature", (July 18, P2-7) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Akihiro Ohiso, Kazutoshi Mizuta, Masuhiro Hiragaki, Yoshiaki Sugimoto, Masayuki Abe and Seizo Morita: "Thermal vs. tip-induced movement of substitutional Pb adatoms at the Ge(111)-c(2×8) surface", (July 18, P2-8) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Insook Yi, Yoshiaki Sugimoto, Ryuji Nishi, Masayuki Abe and Seizo Morita: "NC-AFM study on atomic structure of Ge clusters on Si(111)-(7×7)", (July 18, P2-13) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

R.Nishi, D.Miyagawa, H.Etou, Y.Seino, Insook Yi and S.Morita: "Lateral manipulation of single atomic defect on ionic crystal surface", (July 18, P2-19) NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Seizo Morita: "SPM Roadmaps: Introductory Talk", Special Session on "SPM Roadmap" (July 16, Afternoon) 13:00-13:15 SPM Roadmaps Seizo Morita, NC-AFM2006 9th International Conference on Non-Contact Atomic Force Microscopy, Kobe, Japan, July 16-20, 2006

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Ryuji Nishi, Insook Yi, Yoshihide Seino, Oscar Custance, M.Abe, Pablo Pou, Pavel Jelinek and Ruben Perez: "Site-Specific Force Spectroscopy, Atom Manipulation and Artificial Nanostructuring", CEAC Summer Workshop on: Nanoanalysis, Monday & Tuesday, July 10 & 11, 2006 in the ETH main building, Lecture hall: HG E 1.1, ETH Zentrum, 8092 Zurich, Switzerland, Keynote lecture Morita Tuesday, 11.7. 09:00-10:00 Chair: V. Sandoghdar (ca. 45 (max. 50) minutes)

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Oscar Custance, M.Abe, Pablo Pou, Pavel Jelinek, and Ruben Perez: Atom manipulation and assembly by mechanical method based on noncontact AFM”, Invited Talk June 8, CIMTEC 2006 (11th International Conferences on Modern Materials and Technologies) Acireale, Sicily, Italy, June 4 to 9, 2006, Special Symposium "Diaclosing Materials at Nanoscale"

Seizo Morita: "Rapidly Developing SPM in Japanese Academia -Status of High Performance UHV-AFM-", 10:00 - 11:30 Opening Session, Invited Talk, 40min including discussions, ISO/TC 229- Nanotechnologies meeting, Tokyo, 21-23 June 2006, Wednesday 21 June,

M.Abe, Y.Sugimoto, O.Custance, and S.Morita: "Toward Artificial Nanostructuring Using Mechanical Atom Manipulation",  Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, February 1 (Wed), 11:00 - 11:20, p.33.

M.Abe, Y.Sugimoto, O.Custance, and S.Morita: "Toward Artificial Nanostructuring Using Mechanical Atom Manipulation",  Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, January 30 (Mon), 16:35-18:00 Poster Session (Room A) P43, p.111.

Atsushi Ishiyama, Noriaki Oyabu, Masayuki Abe, Óscar Custance and Seizo Morita: "Low-temperature NC-AFM experiments on MgO(100)", Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, January 30 (Mon), 16:35-18:00 Poster Session (Room A) P44, p.112.

Insook Yi, R. Nishi, D. Miyagawa, H. Etou, Y. Seino and S. Morita: "Observation of Cleavage Surfaces of the Mixed Alkali Halide Crystals by NC-AFM", Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, January 30 (Mon), 16:35-18:00 Poster Session (Room A) P45, p.113.

R. Nishi, D. Miyagawa, H. Etou, Y. Seino, Insook Yi and S. Morita: "NC-AFM Study on Atomic Defects Formed by Nanoindentation on KBr Ionic Crystal Surface", Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, January 30 (Mon), 16:35-18:00 Poster Session (Room A) P46, p.114.

D. Miyagawa, H. Etou, R. Nishi, Y. Seino, Insook Yi, and S. Morita: "Nano Scale Scratching on Alkali Halide Surface by NC-AFM", Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, January 30 (Mon), 16:35-18:00 Poster Session (Room A) P47, p.115.

S.Innami, M.Hirayama, Y.Sugimoto, M.Abe and S.Morita: "NC-AFM observation of In, Sn, Sb adatoms on Si(111)-(7×7) Surface", Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, January 30 (Mon), 16:35-18:00 Poster Session (Room A) P48, p.116.

Yoshiaki Sugimoto, Masayuki Abe, Oscar Custance and Seizo Morita: "Lateral Manipulation of Si Adatoms on Si(111)-(7×7) Surface Using NC-AFM at Room Temperature", Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, January 30 (Mon), 16:35-18:00 Poster Session (Room A) P49, p.117.

Yoshihide Seino, Shota Yoshikawa, Seizo Morita: "Atomically Resolved NC-AFM Imaging of Group -IIa Flourides/Si (111)", Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, January 30 (Mon), 16:35-18:00 Poster Session (Room A) P50, p.118.

Noriaki Oyabu, Óscar Custance, Masayuki Abe and Seizo Morita: "Non-contact Atomic Force Microscopy using Diamond Coated Tips", Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30-February 1, 2006, Icho Kaikan, Osaka University, Japan, January 30 (Mon), 16:35-18:00 Poster Session (Room A) P51, p.119.

2005年

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Masayuki Abe and Oscar Custance: "Site-Specific Spectroscopy and Atom Manipulation by AFM", 5th International Symposium on Atomic Level Characterizations (ALC05), December 04 (Sun) to 09 (Fri), 2005, Outrigger Keauhou Beach Resort, The Big-Island, Hawaii, U.S.A., December 5, 2005 (Monday), Room B: K1,14:40~15:10, 05WS02, Workshop: Rapidly Developing High-performance/High-resolution AFM,14:40~15:10, 05WS02

Yoshihide Seino, Shota Yoshikawa, Masayuki Abe, Seizo Morita: "Atomically resolved NC-AFM imaging of group -IIa flouride/Si (111)", The 2005 Fall Meeting of the Materials Research Society, Boston, MA, USA, Nov.28~Dec.2, 2005, SESSION NN: Scanning Probe Microscopy in Materials Research, November 28 - December 1, 2005, SESSION NN2: Studying Surfaces with Noncontact AFM and STM, Chair: Suzi Jarvis, Monday Morning, November 28, 2005, Back Bay C (Sheraton), 10:45~11:00 AM *NN2.2

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Oscar Custance and M.Abe: "Mechanical Atom Manipulation and Artificial Nanostructuring at Room Temperature based on Noncontact-AFM Method", The 2005 Fall Meeting of the Materials Research Society, Boston, MA, USA, Nov.28~Dec.2, 2005, SESSION NN: Scanning Probe Microscopy in Materials Research, November 28 - December 1, 2005, SESSION NN2: Studying Surfaces with Noncontact AFM and STM, Chair: Suzi Jarvis, Monday Morning, November 28, 2005, Back Bay C (Sheraton), 11:00~11:30 AM *NN2.3

S.Morita, Y.Sugimoto, N.Oyabu, M.Abe and O.Custance: Mechanical Manipulation of Single Atoms at Semiconductor Surfaces based on Noncontact Atomic Force Microscopy, Abstracts of International Symposium on Surface Science and Nanotechnology, November 14-17, 2005, Omiya Sonic City, Saitama, Japan, Organized by The Surface Science Society of Japan (SSSJ). Monday, November 14, 15:00-15:30, Conference Room A, Mo-A7(I), p.10.

Y. Sugimoto, M. Abe, and S. Morita: "Highly resolved non-contact atomic force microscopy images of semiconductor surfaces", Trends in Nanotechnology (TNT 2005), Oviedo, Spain, 29 August to 02 September 2005, p132

N. Oyabu, O. Custance, M. Abe and S. Morita: "Measuring the Forces during the Mechanical Vertical Manipulation of Single Atoms at Semiconductor surfaces", Trends inNanotechnology (TNT 2005), Oviedo (Spain), 29 August to 02 September, 2005, p.136

M. Abe, Y. Sugimoto, K. Mizuta, K. Morita, O. Custance, and S. Morita: "Site-specific force spectroscopy at room temperature using atom tracking technique", Trends in Nanotechnology (TNT 2005), Oviedo, Spain, 29 August to 02 September 2005, p132

O. Custance, Y. Sugimoto, N. Oyabu, M. Abe, and S. Morita: "Lateral manipulation of single atoms using atomic force microscopy", 6th International conference on Trends in Nanotechnology (TNT 2005), Oviedo (Spain) 29. August to 02 September 2005, Keynote talk, Monday, 29, August, 2005, 12:00-12:30, p.25

Y. Sugimoto, M. Abe, O. Custance, and S. Morita: "Atom inlays performed at room temperature using atomic force microscopy", European Conference on Surface Science (ECOSS 2005), 23 Berlin, Germany, p66

N.Oyabu, O.Custance, Y.Sugimoto, M.Abe and S.Morita: "Interchange Manipulation of Sn and Ge Atoms on Ge(111)-c(2x8) at 80K", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy Bad Essen (Germany) 15. to 18. August 2005, Tuesday, 16, August 2005, 16:00-16:20, p.34.

Y.Sugimoto, M.Abe, O.Custance and S.Morita: "Room-temperature lateral manipulation of the Si(111)7x7 adatoms", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen (Germany) 15. to 18. August 2005, Tuesday, 16, August 2005, 16:20-16:40, p.35.

P.Jelinek, P.P.Bell, N.Oyabu, M.Abe, O.Custance, S.Morita and R.Perez: "Imaging and Manipulation of Single Atoms on the Si(111)-(7x7) Surface ", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen (Germany) 15. to 18. August 2005, Tuesday, 16, August 2005, 16:40-17:00, p.36.

A.Ishiyama, N.Oyabu, M.Abe, O.Custance and S.Morita: "Low-temperature NC-AFM experiments on MgO(100)", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen (Germany) 15. to 18. August 2005, Wednesday 17, 18:00-20:00 Poster Session, August 2005, P4, p.72.

Y.Seino, S.Yoshikawa, R.Nishi, M.Abe and S.Morita: "High-resolution imaging of CaF2/Si (111) surface using atomic resolution NC-AFM ", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen (Germany) 15. to 18. August 2005, Wednesday 17, 18:00-20:00 Poster Session, August 2005, P9, p.77.

E.Etou, D.Miyagawa, R.Nishi, Y.Seino, I.Yi and S.Morita: "NC-AFM observation on cleavage surfaces of the mixed alkali halide crystal ", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen (Germany) 15. to 18. August 2005, Wednesday 17, 18:00-20:00 Poster Session, August 2005, P10, p.78.

R.Nishi, D.Miyagawa, E.Etou, Y.Seino, I.Yi and S.Morita: "NC-AFM study on atomic defects formed on ionic crystal surface by nanoindentation ", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen (Germany) 15. to 18. August 2005, Wednesday 17, 18:00-20:00 Poster Session, August 2005, P11, p.79.

D.Miyagawa, E.Etou, R.Nishi, Y.Seino, I.Yi and S.Morita: "Atomic step structure formed by nanoscratching on alkali halide surface using an AFM ", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen (Germany) 15. to 18. August 2005, Wednesday 17, 18:00-20:00 Poster Session, August 2005, P12, p.80.

M.Hirayama, Y.Sugimoto, M.Abe and S.Morita: "Chemical bonding behavior of In, Sn and Sb adatoms on the Si(111)-(7x7) ", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen (Germany) 15. to 18. August 2005, Wednesday 17, 18:00-20:00 Poster Session, August 2005, P19, p.87.

M.Abe, Y.Sugimoto, K.Mizuta, K.Morita, O.Custance and S.Morita: "Reproducible site-specific force spectroscopy at room temperature ", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy Bad Essen (Germany) 15. to 18. August 2005, Thursday, 18, August 2005, 9:20-9:40, p.56.

N.Oyabu, P.P.Bell, M.Abe, O.Custance, S.Morita and R.Perez: "Spatial force spectroscopy on Ge(111)-c(2x8): theory and experiments ", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy Bad Essen (Germany) 15. to 18. August 2005, Thursday, 18, August 2005, 9:40-10:00, p.57.

N.Oyabu, O.Custance, M.Abe and S.Morita: "Non-contact Atomic Force Microscopy using Diamond Coated Tips ", Abstracts of 8th International Conference on Non-Contact Atomic Force Microscopy Bad Essen (Germany) 15. to 18. August 2005, Thursday, 18, August 2005, 17:30-19:30 Poster Session, August 2005, P65, p.135.

Y. Sugimoto, M. Abe, O. Custance and S. Morita: Atom assembly using atomic force microscopy at room temperature, Abstracts of 13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques in conjunction with 13th International Colloquium on Scanning Probe Microscopy, July 3-8, 2005, Sapporo Convention Center, Japan. Organized by The Japan Society of Applied Physics. Thursday July 7 10:45 Thu-7-C1, p.451.

M.Abe, Y.Sugimoto, K.Mizuta, K.Morita and S.Morita: Discrimination of Atom Species Using Site-Specific Force Spectroscopy at Room Temperature, Abstracts of 13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques in conjunction with 13th International Colloquium on Scanning Probe Microscopy, July 3-8, 2005, Sapporo Convention Center, Japan. Organized by The Japan Society of Applied Physics. Tuesday July 5 18:00-20:00 Tue-Pos-70, p.266.

 

2004年

Y. Seino, M. Abe and S. Morita: "Atomically Resolved NC-AFM Imaging on CaF2/Si(111) Surface", Abstracts of The 12th International Colloquium on Scanning Probe Microscopy, Atagawa Hights, Shizuoka, Japan, December 9-11, 2004, p.97.

I. Yi, Y. Sugimoto, R. Nishi, Y. Seino and S. Morita: "NC-AFM Observation of the √3×√3 to the 3×3 Phase Transition in Sn/Ge(111) and Sn/Si(111) semiconductor surfaces", Abstracts of The 12th International Colloquium on Scanning Probe Microscopy, Atagawa Hights, Shizuoka, Japan, December 9-11, 2004, p.98.

I. Yi, Y. Sugimoto, J. Heo, M. Abe and S. Morita:"NC-AFM Study on Interaction Force Depending on a Distance between the tip and the sample in γ- and α-Sn/Si(111)-(√3×√3)R30° Surface", Abstracts of The 12th
International Colloquium on Scanning Probe Microscopy, Atagawa Hights, Shizuoka, Japan, December 9-11, 2004, p.99.

S. Morita, Y.Sugimoto, N.Oyabu, O.Custance and M.Abe: "Atom Inlay Figured by Atom-Exchange Manipulation at Room Temperature", Abstracts of International Workshop on "Materials Science and Nano-Engineering" (Invited Talk), Osaka University, 21st Century Center of Excellence Program Core Research and Advanced Education Center for Materials Science and Nano-Engineering Graduate School of Engineering Science, 11-14 December 2004, Osaka, Japan, 2004, A-08, p.8.

N. Oyabu, O.Custance, M.Abe and S.Morita: "Mechanical vertical single atom manipulation on semiconductor surfaces using noncontact atomic force microscopy", Abstracts of International Workshop on "Materials Science and Nano-Engineering", Osaka University, 21st Century Center of Excellence Program Core Research and Advanced Education Center for Materials Science and Nano-Engineering Graduate School of Engineering Science, 11-14 December 2004, Osaka, Japan, 2004, PA-13, p.61.

R. Nishi, D.Miyagawa, Y.Seino, I.Yi and S.Morita: "Observation of cleaved ionic crystal surfaces with atomic resolution by noncontact atomic force microscope in ultra-high vacuum", Abstracts of International Workshop on "Materials Science and Nano-Engineering", Osaka University, 21st Century Center of Excellence Program Core Research and Advanced Education Center for Materials Science and Nano-Engineering Graduate School of Engineering Science, 11-14 December 2004, Osaka, Japan, 2004, PA-14, p.62.


Y. Sugimoto, M.Abe, S.Hirayama, N.Oyabu, O.Custance and S.Morita: "'Atom inlays' performed at room temperature usingatomic force microscopy", Abstracts of International Workshop on "Materials Science and Nano-Engineering", Osaka University, 21st Century Center of Excellence Program Core Research and Advanced Education Center for Materials Science and Nano-Engineering Graduate School of Engineering Science, 11-14 December 2004, Osaka, Japan, 2004, PA-15, p.63.

Y. Seino, M.Kuwata, M.Abe and S.Morita: "Atom-resolved nc-AFM Observation on CaF2/Si(111) surface", Abstracts of International Workshop on "Materials Science and Nano-Engineering", Osaka University, 21st Century Center of Excellence Program Core Research and Advanced Education Center for Materials Science and Nano-Engineering Graduate School of Engineering Science, 11-14 December 2004, Osaka, Japan, 2004, PA-16, p.64.

I. Yi, Y.Sugimoto, R.Nishi, Y.Seino and S.Morita: "NC-AFM observation of the √3 × √3 to the 3 × 3 phase transition in Sn/Ge(111) and Sn/Si(111) semiconductor surfaces", Abstracts of International Workshop on "Materials Science and Nano-Engineering", Osaka University, 21st Century Center of Excellence Program Core Research and Advanced Education Center for Materials Science and Nano-Engineering Graduate School of Engineering Science, 11-14 December 2004, Osaka, Japan, 2004, PA-18, p.66.

S.Morita, Y.Sugimoto, N.Oyabu, O.Custance and M.Abe: "Mechanical Atom Manipulation Using Near Contact Atomic Force Microscope" (Invited Talk), Abstracts of 8th SANKEN International Symposium & 3rd International Symposium on Scientific and Industrial Nanotechnology, SANKEN International Symposium on Scientific and Industrial Nanotechnology 2004 "Advanced Characterization for Nanomaterials, Nanodevices and Nanoprocessing", December 6-7, 2004, Osaka, 2004, pp.30-31.

S.Morita, N.Oyabu, Y.Sugimoto, O.Custance, M.Abe and R.Nishi: "Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact-AFM Method" (Invited Talk), 9:00 *AM O1.3, Abstracts of Materials Research Society 2004 Fall meeting, the Symposium O "Scanning Probe and Other Novel Microscopies of Local Phenomena in Nanostructure Materials", Session O.1; SPM at the Limits of Resolution, Nov. 29 - Dec. 3, Boston, MA [MRS 2004 Fall], USA, 2004, p.365.

Y.Seino, M.Abe and S.Morita: "Atomically Resolved Imaging of Epitaxial CaF2 on Si(111) using Non-contact Atomic Force Microscope", 11:30 AM O1.9, Abstracts of Materials Research Society 2004 Fall meeting, the Symposium O "Scanning Probe and Other Novel Microscopies of Local Phenomena in Nanostructure Materials", Session O.1; SPM at the Limits of Resolution, Nov. 29 - Dec. 3, Boston, MA [MRS 2004 Fall], USA, 2004, p.366.

N.Oyabu, Y.Sugimoto, O.Custance, M.Abe and S.Morita: "Using Noncontact Atomic Force Microscopy for Laterally Manipulating Single Atoms at Semiconductor Surfaces", Abstracts of Seventh International Conference on non-contact Atomic Force Microscopy, Seattle, Washington, USA, 12-15 September, 2004, p.33.

N.Oyabu, O.Custance, M.Abe and S.Morita: "Mechanical Vertical Manipulation of Single Atoms on the Ge(111)-c(2x8) Surface by Noncontact Atomic Force Microscopy", Abstracts of Seventh International Conference on non-contact Atomic Force Microscopy, Seattle, Washington, USA, 12-15 September, 2004, p.34.

Y.Sugimoto, M.Abe, O.Custance, I.Yi and S.Morita: "Surrounding Atom Effect on NC-AFM Images of the Sn/Si(111) Surface Adatoms", Abstracts of Seventh International Conference on non-contact Atomic Force Microscopy, Seattle, Washington, USA, 12-15 September, 2004, p.54.

S.Hirayama, Y.Sugimoto, M.Abe, O.Custance and S.Morita: "Highly Resloved Non-contact Atomic Force Microscopy Images of the Sn/Si(111)-(2√3x2√3) Surface", Abstracts of Seventh International Conference on non-contact Atomic Force Microscopy, Seattle, Washington, USA, 12-15 September, 2004, p.69.

S.Konoshita, Y.Sugimoto, M.Abe and S.Morita: "Observation of the c(4x8) surface periodicity on Iron Silicide thin films Using NC-AFM", Abstracts of Seventh International Conference on non-contact Atomic Force Microscopy, Seattle, Washington, USA, 12-15 September, 2004, p.74.

M.Abe, Y.Sugimoto, O.Custance, I.Yi and S.Morita: "Atom Discrimination on Various Reconstructed Surfaces of Sn/Ge(111) Using NC-AFM", Abstracts of Seventh International Conference on non-contact Atomic Force Microscopy, Seattle, Washington, USA, 12-15 September, 2004, p.85.

S.Morita: "Mechanical Distinction and Manipulation of Atoms Based on Noncontact Atomic Force Microscopy", Abstracts of The 9th International Symposium on Advanced Physical Fields (APF-9) "Characterization of Artificial Nanostructures and Nanomaterials", Tsukuba, Japan, March 1-4, 2004, p.23.

Y.Sugimoto, M.Abe, K.Yoshimoto, O.Custance, I.Yi and S.Morita: "A noncontact atomic force microscopy study of Sn/Si(111)√3x√3 mosaic phase surface", Abstracts of The 9th International Symposium on Advanced Physical Fields (APF-9) "Characterization of Artificial Nanostructures and Nanomaterials", Tsukuba, Japan, March 1-4, 2004, p.64.

 

2003年

 N.Oyabu, O,Custance, I.Yi, Y.Sugawara and S.Morita: "Vertical Manipulation of Single Atoms with Near Contact Atomic Force Microscopy", 6th International Conference on Noncontact Atomic Force Microscopy (ncAFM03), Aug.31-Sept.3, 2003, Dingle, Ireland.

N.Oyabu, O,Custance, I.Yi, Y.Sugawara and S.Morita: "NC-AFM of the Ge(111)-c(2x8) Surface", 6th International Conference on Noncontact Atomic Force Microscopy (ncAFM03), Aug.31-Sept.3, 2003, Dingle, Ireland.

I.Yi, N.Oyabu, O,Custance, R.Nishi, Y.Sugawara and S.Morita: "NC-AFM Study on Ge Clusters Grown on Si(111)7x7 Surface", 6th International Conference on Noncontact Atomic Force Microscopy (ncAFM03), Aug.31-Sept.3, 2003, Dingle, Ireland.

Y.Sugimoto, M.Abe, N.Oyabu, O,Custance and S.Morita: "Mechanical vertical manipulation of single Si atom at room temperature", 1st International Symposium on Active Nano-Characterization and Technology (ANCT2003), Nov.12-14, 2003, National Institute for Materials Sciences (NIMS), Tsukuba, Japan.

M.Abe, Y.Sugawara and S.Morita: "Noncontact Atomic Force Microscope in High Magnetic Field", 1st International Symposium on Active Nano-Characterization and Technology (ANCT2003), Nov.12-14, 2003, National Institute for Materials Sciences (NIMS), Tsukuba, Japan.

K.Yoshimoto, S.Konoshita, Y.Sugimoto, M.Abe, S.Morita, T.Kaizu, K.Yamaguchi, K.Matsuda, T.Saiki and D.Fujita: "Kelvin Probe Force Microscopy Measurement of InAs Quantum Dots", 1st International Symposium on Active Nano-Characterization and Technology (ANCT2003), Nov.12-14, 2003, National Institute for Materials Sciences (NIMS), Tsukuba, Japan.

N.Oyabu, O,Custance, I.Yi, Y.Sugawara and S.Morita: "Mechanical Vertical Manipulation of Single Atoms Using Noncontact Atomic Force Microscopy", the 7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nov.16-20, 2003, Nara, Japan.

R.Nishi, K.Kitano and S.Morita: "The Quartz Resonator as a Force Sensor for Atomic Force Microscopy in Liquid Environment", the 7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nov.16-20, 2003, Nara, Japan.

Y.Seino, T.Kato, M.Abe and S.Morita: "High Resolution Surface Photovoltage Imaging by Noncontact Atomic Force Microscopy", the 7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nov.16-20, 2003, Nara, Japan.

 I.Yi, N.Oyabu, O,Custance, R.Nishi, Y.Seino and S.Morita: "Study on Self-assembled Ge Clusters Grown on Si(111)7x7 Surface by Noncontact-Atomic Force Microscopy", the 7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nov.16-20, 2003, Nara, Japan.

K.Shirai, R.Nishi, I.Yi, Y.Seino and S.Morita: "Unstable adsorption of oxygen on Si(111)7x7 observed by noncontact atomic force microscopy", the 11th International Colloquium on Scanning Probe Microscopy, Dec.11-13, 2003, Atagawa, Japan.

S.Morita: "Noncontact Atomic Force Microscopy on Semiconductor Surfaces", Osaka University-EU.LMU Forum 2003 with the cooperation of CeNS, January 16-17, 2003,

S.Morita and Y.Sugawara: "Atom Selective Imaging and Mechanical Atom Manipulation Based on Noncontact Atomic Force Microscope Method", 4th International Symposium on Atomic Level Characterizations for New Materials and Devices '03 (ALC03), October 5-10, 2003, Radisson Kauai Beach Resort, Kauai, Hawaii, USA.

S.Morita and Y.Sugawara: " Atom Selective Imaging and Mechanical Atom Manipulation Using Noncontact Atomic Force Microscope", 1st International Symposium on Active Nano-Characterization and Technology (ANCT2003), Nov.12-14, 2003, National Institute for Materials Sciences (NIMS), Tsukuba, Japan.

 

2002年

S.Morita and Y.Sugawara: "Characterization of Semiconductor Surfaces With Noncontact Atomic Force Microscopy", The International Workshop on Nanotechnology and NICE Devices (IWNND 2002), March 19-20, 2002, Nagoya Congress Ceter, Nagoya, Japan

S.Morita and Y.Sugawara: "Single Atom Tribology -From Non-Contact AFM to Near-Contact AFM-", 2nd International Workshop on Microtribology -Microtribology for macro systems-(IWM2002), April 16-19, 2002, Ishigaki Island, Japan

Y.Sugawara, N.Oyabu, N.Nakata, T.Nishimoto, E.Sugitachi, I.Yi and S.Morita: "Atom Manipulation and Identification Using NC-AFM", 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, 2002, Montreal, Canada.

S.Morita: "Panel Discussion: Summary, New Developments, Major Issues and Open Questions", Pannler, 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, 2002, Montreal, Canada.

S.Morita and Y.Sugawara: "SPATIAL RESOLUTIONS AND FUNCTIONS OF NONCONTACT ATOMIC FORCE MICROSCOPE", the third "Trends in NanoTechnology" International Conference (TNT2002), September 9-13, 2002, Santiago de Compostela, Spain.

K.Okamoto, K.Yoshimoto, Y.Sugawara and S.Morita: "KPFM Imaging of Si(111)5O3´5O3-Sb Surface for Atom Distinction Using NC-AFM", 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, 2002, Montreal, Canada.

N.Nakata, Y.Sano, N.Oyabu, M.Mikami, Y.Sugawara and S.Morita: "Analysis of Atom Manipulation by Near-contact Atomic Force Microsope", 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, 2002, Montreal, Canada.

R.Nishi, A.Araragi, K.Shirai, Y.Sugawara and S.Morita: "Atom Selective Imaging by NC-AFM: Case of Oxygen Adsorbed Si(111)7x7 Surface", 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, 2002, Montreal, Canada.

N.Oyabu, Y.Sano, N.Nakata, M.Mikami, Y.Sugawara and S.Morita: "Mechanical Removal of Single Silicon Adatoms on Si(111)7x7 Surface by Using NC-AFM", 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, 2002, Montreal, Canada.

E.Sugitachi, S.Imai, T.Nishimoto, Y.Sugawara and S.Morita: "Atom Selective Imaging of Si/Al Intermixing Si(111) Surface Using NC-AFM", 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, 2002, Montreal, Canada.

T.Nishimoto, E.Sugitachi, T.Katou, I.Yi, Y.Sugawara and S.Morita: "Identification of Group Ⅳ Elements on Si/Ge Intermixing Surface Using NC-AFM", 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, 2002, Montreal, Canada.

Y.Miyazaki, T.Uozumi, Y.Sugawara and S.Morita: "Observation of Si(111)-O3√O3-Ag Surface by LT-NC-AFM", 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, 2002, Montreal, Canada.

Y.Seino, Y.Sugawara and S.Morita: "High resolution Near-field Imagings of SAM using noncontact AFM", 5th International Conference on Noncontact Atomic Force Microscopy (NC-AFM2002), August 11-14, Montreal, Canada

S.Morita and Y.Sugawara: "Functions of NC-AFM on Atomic Scale", Advanced Study Institute NATO on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, October 1-13, 2002,Albufeira, Algarve, Portugal.

S.Morita and Y.Sugawara: "Microscale contact charging on a silicon oxide", Advanced Study Institute NATO on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, October 1-13, 2002,Albufeira, Algarve, Portugal.

S.Morita and Y.Sugawara: "Atom Selective Imaging and Mechanical Atom Manipulation by Noncontact-AFM", International Colloquium on SPM(10) (ICSPM10), October 31- November 2, 2002, Waikiki, Hawaii, USA.

S.Morita and Y.Sugawara: "Atom Selective Imaging and Mechanical Atom Manipulation by Noncontact Atomic Force Microscopy", China-Japan Joint Seminar on Atomic Level Characterization-2002 (China-Japan SALC 2002), November 4-8, 2002, Guilin, China.

S.Morita and Y.Sugawara: "Mechanical Manipulation and Identification of Semiconductor Atoms by Noncontact Atomic Force Microscope", SEMICON Japan 2002 SEMI Technology Symposium (STS) 2002, December 4-6, 2002, Chiba, Japan.

 

2001年

 S.Morita, "Introduction", International Symposium: Future of Nanoprobe Technology for Single Molecule and Single Cell Analysis Organized by The Japan Society for the Promotion of Science (JSPS) and JSPS 167th Nano-Probe Technology Committee, Jan. 19, 2001, Tokyo, Japan.

Y.Sugawara, "Force Imaging of Optical Near Field Using Noncontact Atomic Force Microscopy", The 43rd Seminar on Science and Technology, Near Field Optics Techniques, 21-22 March, 2001, Tokyo, Japan (Invited Talk).

S.Morita and Y.Sugawara: "Atomically Resolved Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy", Scanning Probe Microscopy, Sensors and Nanostructures Tokyo 2001, May 27-31, 2001, Makuhari, Chiba, Japan

 Y.Sugawara and S.Morita: "Identification of Atom Species on Semiconductor Surfaces Using Noncontact Atomic Force Microscopy (NC-AFM)", The 1st International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '01 (QNN'01), July 2-4, 2001, Tsukuba, Japan.

Y.Sugawara, S.Imai, Y.Sano and S.Morita: "Functional Extension of NC-AFM: Atom Identification and Manipulation ", The 4th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2001), September 1-5, 2001, Kyoto, Japan.

S.Morita, S.Araragi, A.Yoshimoto, T.Uozumi, Y.Tomiyoshi, N.Suehira and Y.Sugawara: "Atomically resolved images of Si(100)2x1, Si(100)2x1:H monohydride and Si(100)1x1:2H dihydride surfaces observed with noncontact atomic force microscopy", The 6th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN 6), July 9-12, 2001, Lake Tahoe, California, USA

N.Oyabu, Y.Sano, N.Suehira, Y.Sugawara and S.Morita: "Removal and Deposition of Silicon Atoms on Si(111)7x7 Surface by Using Noncontact Atomic Force Microscope", The 6th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN 6), July 9-12, 2001, Lake Tahoe, California, USA

E.Sugitachi, S.Imai, E.Hidaka, Y.Sugawara and S.Morita: "Atom Selective Imaging of Si(111) Surface with Intermixed Si/Sb Atoms Using NC-AFM", The 6th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN 6), July 9-12, 2001, Lake Tahoe, California, USA

K.Okamoto, Y.Sugawara and S.Morita: "Novel 'Artifact-free' System of Noncontact Atomic Force microscope/Electrostatic Force Microscope", 11th International Conference on Scanning Tunneling Microscope/Spectroscopy and Related Techniques, July 15-20, 2001, Vancouver, Canada

S.Imai, E.Hidaka, Y.Sugawara and S.Morita: "Atom-selective imaging of Si/Sb intermixing Si(111)5O3´5O3-Sb surface using NC-AFM", 11th International Conference on Scanning Tunneling Microscope/Spectroscopy and Related Techniques, July 15-20, 2001, Vancouver, Canada

T.Uozumi, Y.Tomiyoshi, N.Suehira, Y.Sugawara and S.Morita: "Observation of Si(100) surface with non-contact atomic force microscope at 5 K ", 11th International Conference on Scanning Tunneling Microscope/Spectroscopy and Related Techniques, July 15-20, 2001, Vancouver, Canada

K.Okamoto, Y.Sugawara and S.Morita: "The Elimination of the 'Artifact' in the Electrostatic Force Measurement using a Novel Noncontact Atomic Force microscope/Electrostatic Force Microscope", 4th International Conference on Noncontact Atomic Force microscopy (NC-AFM 2001), Sept.1-5, 2001, Kyoto, Japan

T.Uchihashi, T.Ishida, W.Mizutani, Y.Sugawara, H.Tokumoto, M.Ishikawa and S.Morita: "Noncontact Atomic Force Microscopy of n-Alkanethiol Self-Assembled Monolayers on Gold Surfaces", 4th International Conference on Noncontact Atomic Force microscopy (NC-AFM 2001), Sept.1-5, 2001, Kyoto, Japan

S.Araragi, A.Yoshimoto, N.Nakata, Y.Sugawara and S.Morita: "Atomic Resolution Imaging of Si(100)1x1:2H Dyhydride Surface with Non-contact Atomic Force Microscopy (NC-AFM)", 4th International Conference on Noncontact Atomic Force microscopy (NC-AFM 2001), Sept.1-5, 2001, Kyoto, Japan

S.Imai, E.Hidaka, E.Sugitachi, Y.Sugawara and S.Morita: "Identification of Si and Sb atoms on Si(111)5√3x5√3-Sb surface using NC-AFM", 4th International Conference on Noncontact Atomic Force microscopy (NC-AFM 2001), Sept.1-5, 2001, Kyoto, Japan

T.Uozumi, Y.Tomiyoshi, N.Suehira, Y.Sugawara and S.Morita: "C(4x2) asymmetric structure of Si(100) surface at 5 K observed with NC-AFM", 4th International Conference on Noncontact Atomic Force microscopy (NC-AFM 2001), Sept.1-5, 2001, Kyoto, Japan

Y.Sugawara, N.Suehira and S.Morita: "Artifact and Fact of Si(111)7x7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM)", 4th International Conference on Noncontact Atomic Force microscopy (NC-AFM 2001), Sept.1-5, 2001, Kyoto, Japan

Y.Sugawara, N.Suehira, Y.Tomiyoshi, T.Uozumi, Y.Sano and S.Morita: "Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM) with Quick Sample and Cantilever Exchange Mechanism", 4th International Conference on Noncontact Atomic Force microscopy (NC-AFM 2001), Sept.1-5, 2001, Kyoto, Japan

Y.Sano, N.Oyabu, N.Suehira, Y.Sugawara and S.Morita: "Removal and deposition of atoms on Si(111)7x7 surface by field evaporation using Noncontact Atomic Force Microscope (NC-AFM)", 4th International Conference on Noncontact Atomic Force microscopy (NC-AFM 2001), Sept.1-5, 2001, Kyoto, Japan

Y.Toriyama, K.Masumitu, Y.Miyazaki, Y.Sugawara and S.Morita: "Development of the scanning near field optical microscope Measuring df component", 4th International Conference on Noncontact Atomic Force microscopy (NC-AFM 2001), Sept.1-5, 2001, Kyoto, Japan

K.Okamoto, Y.Sugawara and S.Morita: "Electrostatic Force Measurement Using Noncontact Atomic Force microscopy", The 9th International Colloquium on Scanning Probe Microscopy, Dec.6-8, 2001, Atagawa, Japan

N.Oyabu, M.Mikami, N.Nakata, Y.Sano, Y.Sugawara and S.Morita: "Removal and deposition of silicon atoms on Si(111)7x7 by using noncontact atomic force microscope", The 9th International Colloquium on Scanning Probe Microscopy, Dec.6-8, 2001, Atagawa, Japan

R.Nishi, A.Araragi, K.Shirai, Y.Sugawara and S.Morita: "NC-AFM imaging of oxygen adsorbed Si(111)7x7", The 9th International Colloquium on Scanning Probe Microscopy, Dec.6-8, 2001, Atagawa, Japan

 

2000年

Y.Sugawara, K.Yokoyama, T.Ochi, A.Yoshimoto and S.Morita: "Noncontact AFM Imaging of Si(100)2x1 and Si(100)2x1:H Surfaces", The 5th International Symposium on Advanced Physical Fields, Tsukuba, March 6-9, 2000.

S.Morita and Y.Sugawara; "Atomic force mapping and control of atomic force on a Si(111)√3x√3-Ag surface using a noncontact atomic force microscopy", Microbeam Analysis 2000, Hawaii, USA, 9-14 July, 2000.

Y.Sugawara, K.Yokoyama and S.Morita, "Applications of Noncontact AFM with True Atomic Resolution", Third International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2000), Hamburg, Germany, July 16-19, 2000 (Invited Talk).

S.Morita, Y.Sugawara, K.Yokoyama, T.Ochi and A.Yoshimoto, "Noncontact AFM Imaging Mechanism of Si(100)2x1 Surface Compared with Si(100)2x1:H Surface on Atomic Scale", Third International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2000), Hamburg, Germany, July 16-19, 2000.

M.Ashino, Y.Sugawara, S.Morita and M.Ishikawa, "Noncontact Atomic Force Microscopy of Oxygen-Deficient TiO2(110) surfaces", Third International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2000), Hamburg, Germany, July 16-19, 2000.

E.Hidaka, S.Orisaka, Y.Sugawara and S.Morita, "Atomic Resolution Imaging of a Lone-pair using NC-AFM", Third International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2000), Hamburg, Germany, July 16-19, 2000.

N.Suehira, Y.Tomiyoshi, Y.Sugawara and S.Morita, "Development of a Low Temperature Noncontact Atomic Force Microscope using Optical Fiber Interferometer", Third International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2000), Hamburg, Germany, July 16-19, 2000.

R.Nishi, I.Houda, K.Kitano, S.Imai, Y.Sugawara and S.Morita, "Noncontact Atomic Force Microscope in Air with Quartz Resonator using FM Detection Method" , Third International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2000), Hamburg, Germany, July 16-19, 2000.

Y.Sugawara;"Atom Selective AFM Imaging on Si(111)√3x√3-Ag Surface", The International Union of Materials Research Societies -6th International Conference in Asia (IUMRS-ICA 2000), Symposium E: Scanning Probe Microscopy for Materials Characterization (24-26 July 2000, City University of Hong Kong, China)(Invited Talk).

S.Morita, "Friction Force Imaging and Friction Mechanisms with a Lattice Periodicity", NATO-Advanced Study Institute (ASI) Course on Fundamentals of Tribology and Bridging the Gap between the Macro- and Micro/Nanoscales, Keszthely, Hungary, Aug.13-25, 2000 (Invited Talk).

S.Morita, "Atomic Scale Origins of Force Interaction", NATO-Advanced Study Institute (ASI) Course on Fundamentals of Tribology and Bridging the Gap between the Macro- and Micro/Nanoscales, Keszthely, Hungary, Aug.13-25, 2000 (Invited Talk).

Y.Sugawara, S.Orisaka and S.Morita: "Noncontact AFM Imaging on Al-adsorbed Si(111) Surface with an Empty Orbital", The Second International Workshop on noncontact AFM, , Pontresina, Switzerland, September 1-4, 2000.

R.Nishi, I.Houda, T.Aramata, Y.Sugawara and S.Morita: "Phase change Detection of Attractive Force Gradient by Using a Quartz Resonator in Noncontact Atomic Force Microscopy", The Second International Workshop on noncontact AFM, Pontresina, Switzerland, September 1-4, 2000.

T.Uchihashi, M.Ashino, T. Ishida, Y.Sugawara, M.Komiyama, W.Mizutani, Y.Yokoyama, S.Morita, H.Tokumoto and M.Ishikawa: "High Resolution Imaging of Organic Monolayers Using Noncontact AFM", The Second International Workshop on noncontact AFM, Pontresina, Switzerland, September 1-4, 2000.

M.Ashino, T.Uchihashi, K.Yokoyama, Y.Sugawara, S.Morita, and M.Ishikawa: "Atomic-Scale Structures on a Non-Stoichiometric TiO2(110) Surface Studied by Noncontact AFM", The Second International Workshop on noncontact AFM, Pontresina, Switzerland, September 1-4, 2000.

S.Morita and Y.Sugawara, "Atomically resolved imaging of semiconductor surfaces using noncontact atomic force microscopy", 25th International Conference on the Physics of Semiconductors, Osaka, Japan, Sept. 17-22, 2000.

A.Yoshimoto, Y.Sugawara and S.Morita, "Atomic Resolution Imaging of Si(100)2x1-H Surface with Noncontact AFM", American Vacuum Society 47th International Symposium: Vacuum, Thin Films, Surfaces/Interfaces and Processing, NANO 6, Boston, USA, Oct. 2-6, 2000.

Y.Sugawara, "Identification of Atom Species on Semiconductor Surface Using Noncontact AFM" , American Vacuum Society 47th International Symposium: Vacuum, Thin Films, Surfaces/Interfaces and Processing, NANO 6, Boston, USA, Oct. 2-6, 2000 (Invited Talk).

S.Morita and Y.Sugawara, "Mapping and Control of Atomic Force with Noncontact Atomic Force Microscopy", Japan-Switzerland Bilateral Symposium on Science and Technology in Micro/Nano Scale (Riken Symposium), Tokyo, Japan, Oct. 26-28, 2000 (Invited Talk).

S.Morita, Y.Sugawara and N.Suehira, "Mapping and Control of Atomic Force with Noncontact Atomic Force Microscopy", 8th Foresight Conference on Molecular Nanotechnology, Bethesda, Maryland, USA, Nov. 3-5, 2000.

Y.Sugawara, "Identification of Atom Species on Semiconductor Surface Using Noncontact AFM", The 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2000), November 12-16, 2000, Fukuoka, Japan (InVited Talk).

S.Morita and Y.Sugawara, "3D-Mapping and Control of Atomic Force with Noncontact Atomic Force Microscopy", 4th International Workshop on Quantum Functional Devices, Kanazawa, Japan, Nov. 15-17, 2000 (Invited Talk).

S.Morita and Y.Sugawara, "Microscopic Contact Charging and Dissipation", The 4th International Conference on Nano-Molecular Electronics, Kobe, Japan, Dec. 5-7, 2000 (Invited Talk).